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Volumn 52, Issue 3, 2003, Pages 946-949

DNL ADC testing by the exponential shaped voltage

Author keywords

ADC testing; Exponential stimulus; Histogram method

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; THERMAL NOISE;

EID: 0042592965     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.814668     Document Type: Article
Times cited : (40)

References (3)
  • 2
    • 0003619185 scopus 로고    scopus 로고
    • Multi-tone testing of quantisers using PRBS signal
    • Oct.
    • R. A. Belcher, "Multi-tone testing of quantisers using PRBS signal," Comput. Stand. Interfaces, vol. 22, no. 4, pp. 269-279, Oct. 2000.
    • (2000) Comput. Stand. Interfaces , vol.22 , Issue.4 , pp. 269-279
    • Belcher, R.A.1
  • 3
    • 0001839625 scopus 로고    scopus 로고
    • ADC histogram test using small amplitude input waves
    • Vienna, Austria, Sept. 25-28
    • F. Alegria, P. Arpaia, P. Daponte, and A. S. Cruz, "ADC histogram test using small amplitude input waves," in Proc. XVI IMEKO World Congr., vol. 10, Vienna, Austria, Sept. 25-28, 2000, pp. 33-38.
    • (2000) Proc. XVI IMEKO World Congr. , vol.10 , pp. 33-38
    • Alegria, F.1    Arpaia, P.2    Daponte, P.3    Cruz, A.S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.