|
Volumn 52, Issue 3, 2003, Pages 946-949
|
DNL ADC testing by the exponential shaped voltage
|
Author keywords
ADC testing; Exponential stimulus; Histogram method
|
Indexed keywords
CAPACITORS;
ELECTRIC POTENTIAL;
MATHEMATICAL MODELS;
THERMAL NOISE;
INTEGRAL NONLINEARITY (INL);
SIGNAL GENERATORS;
|
EID: 0042592965
PISSN: 00189456
EISSN: None
Source Type: Journal
DOI: 10.1109/TIM.2003.814668 Document Type: Article |
Times cited : (40)
|
References (3)
|