On the use of wavelet transforms in testing for the DNL of ADCs

Midwest Symposium on Circuits and Systems

Volumn 2, Issue , 2002, Pages II25-II28

  Marshall, Rion O ^a   Akujuobi, Cajetan M ^a  

^a PRAIRIE VIEW A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; CODE CONVERTERS; COMPUTER SIMULATION; DISCRETE FOURIER TRANSFORMS; SIGNAL PROCESSING; WAVELET TRANSFORMS;

DIFFERENTIAL NON-LINEARITIES (DNL);

ANALOG TO DIGITAL CONVERSION;

EID: 0036978741     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSCAS.2002.1186788     Document Type: Article

References (10)

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