SCOPUS 정보 검색 플랫폼

Solid State Communications

Volumn 149, Issue 39-40, 2009, Pages 1628-1632

Multi-carrier transport properties in p-type ZnO thin films

(5) Ye, H B a Kong, J F a Pan, W a Shen, W Z a Wang, B b

a SHANGHAI JIAO TONG UNIVERSITY (China)

b FUDAN UNIVERSITY (China)

Author keywords

A. Semiconductor; C. Impurities in semiconductors; D. Electronic transport

Indexed keywords

A. SEMICONDUCTOR; C. IMPURITIES IN SEMICONDUCTORS; CO-DOPED; D. ELECTRONIC TRANSPORT; FREE ELECTRON; FREE HOLES; HALL EFFECT MEASUREMENT; INTERFACE LAYER; MAGNETIC-FIELD; MOBILITY SPECTRUM ANALYSIS; MULTI CARRIER; N-DOPED; N-DOPING; N-IN CODOPING; P TYPE ZNO THIN FILM; P-TYPE CONDUCTIVITY; SI SUBSTRATES; TWO-DIMENSIONAL HOLE GAS; ZNO; ZNO THIN FILM;

COMMUNICATION CHANNELS (INFORMATION THEORY); GALVANOMAGNETIC EFFECTS; HALL MOBILITY; METALLIC FILMS; OPTICAL FILMS; PHASE INTERFACES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; THIN FILMS; TRANSPORT PROPERTIES; ZINC OXIDE;

HOLE MOBILITY;

EID: 68949175655 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2009.06.030 Document Type: Article

Times cited : (3)

References (18)

1
- 25144462707
- Özgür Ü., Alivov Ya.I., Liu C., Teke A., Reshchikov M.A., Doǧan S., Avrutin V., Cho S.-J., and Morkoc H. J. Appl. Phys. 98 (2005) 041301
- (2005) J. Appl. Phys. , vol.98 , pp. 041301
- Özgür, Ü.¹ Alivov, Ya.I.² Liu, C.³ Teke, A.⁴ Reshchikov, M.A.⁵ Doǧan, S.⁶ Avrutin, V.⁷ Cho, S.-J.⁸ Morkoc, H.⁹

2
- 0034972148
- Yamamoto T., and Katayama-Yoshida H. Physica B 302/303 (2001) 155
- (2001) Physica B , vol.302-303 , pp. 155
- Yamamoto, T.¹ Katayama-Yoshida, H.²

3
- 79958230334
- Look D.C., Reynolds D.C., Litton C.W., Jones R.L., Eason D.B., and Cantwell G. Appl. Phys. Lett. 81 (2002) 1830
- (2002) Appl. Phys. Lett. , vol.81 , pp. 1830
- Look, D.C.¹ Reynolds, D.C.² Litton, C.W.³ Jones, R.L.⁴ Eason, D.B.⁵ Cantwell, G.⁶

4
- 8644222175
- Lu J.G., Ye Z.Z., Zhuge F., Zeng Y.J., Zhao B.H., and Zhu L.P. Appl. Phys. Lett. 85 (2004) 3134
- (2004) Appl. Phys. Lett. , vol.85 , pp. 3134
- Lu, J.G.¹ Ye, Z.Z.² Zhuge, F.³ Zeng, Y.J.⁴ Zhao, B.H.⁵ Zhu, L.P.⁶

5
- 24644514553
- Zhuge F., Zhu L.P., Ye Z.Z., Ma D.W., Lu J.G., Huang J.Y., Wang F.Z., Ji Z.G., and Zhang S.B. Appl. Phys. Lett. 87 (2005) 092103
- (2005) Appl. Phys. Lett. , vol.87 , pp. 092103
- Zhuge, F.¹ Zhu, L.P.² Ye, Z.Z.³ Ma, D.W.⁴ Lu, J.G.⁵ Huang, J.Y.⁶ Wang, F.Z.⁷ Ji, Z.G.⁸ Zhang, S.B.⁹

6
- 29144526720
- Chen L.L., Lu J.G., Ye Z.Z., Lin Y.M., Zhao B.H., Ye Y.M., Li J.S., and Zhu L.P. Appl. Phys. Lett. 87 (2005) 252106
- (2005) Appl. Phys. Lett. , vol.87 , pp. 252106
- Chen, L.L.¹ Lu, J.G.² Ye, Z.Z.³ Lin, Y.M.⁴ Zhao, B.H.⁵ Ye, Y.M.⁶ Li, J.S.⁷ Zhu, L.P.⁸

7
- 10044250159
- Bian J.M., Li X.M., Zhang C.Y., Yu W.D., and Gao X.D. Appl. Phys. Lett. 85 (2004) 4070
- (2004) Appl. Phys. Lett. , vol.85 , pp. 4070
- Bian, J.M.¹ Li, X.M.² Zhang, C.Y.³ Yu, W.D.⁴ Gao, X.D.⁵

8
- 33646867268
- Lopatiuk-Tirpak O., Schoenfeld W.V., Chernyak L., Xiu F.X., Liu J.L., Jang S., Ren F., Pearton S.J., Osinsky A., and Chow P. Appl. Phys. Lett. 88 (2006) 202110
- (2006) Appl. Phys. Lett. , vol.88 , pp. 202110
- Lopatiuk-Tirpak, O.¹ Schoenfeld, W.V.² Chernyak, L.³ Xiu, F.X.⁴ Liu, J.L.⁵ Jang, S.⁶ Ren, F.⁷ Pearton, S.J.⁸ Osinsky, A.⁹ Chow, P.¹⁰

9
- 33947128809
- Ye H.B., Kong J.F., Shen W.Z., Zhao J.L., and Li X.M. Appl. Phys. Lett. 90 (2007) 102115
- (2007) Appl. Phys. Lett. , vol.90 , pp. 102115
- Ye, H.B.¹ Kong, J.F.² Shen, W.Z.³ Zhao, J.L.⁴ Li, X.M.⁵

10
- 0000745208
- Beck W.A., and Anderson J.R. J. Appl. Phys. 62 (1987) 541
- (1987) J. Appl. Phys. , vol.62 , pp. 541
- Beck, W.A.¹ Anderson, J.R.²

11
- 34548418136
- Ye H.B., Kong J.F., Shen W.Z., Zhao J.L., and Li X.M. J. Physica D: Appl. Phys. 40 (2007) 5588
- (2007) J. Physica D: Appl. Phys. , vol.40 , pp. 5588
- Ye, H.B.¹ Kong, J.F.² Shen, W.Z.³ Zhao, J.L.⁴ Li, X.M.⁵

12
- 0002860095
- Dziuba Z., and Gorska M. J. Phys. III 2 (1992) 99
- (1992) J. Phys. III , vol.2 , pp. 99
- Dziuba, Z.¹ Gorska, M.²

13
- 0029379223
- Antoszewski J., Seymour D.J., Faraone L., Meyer J.R., and Hoffman C.A. J. Electron. Mater. 24 (1995) 1255
- (1995) J. Electron. Mater. , vol.24 , pp. 1255
- Antoszewski, J.¹ Seymour, D.J.² Faraone, L.³ Meyer, J.R.⁴ Hoffman, C.A.⁵

14
- 0000377727
- Vurgaftman I., Meyer J.R., Hoffman C.A., Redfern D., Antoszewski J., Faraone L., and Lindemuth J.R. J. Appl. Phys. 84 (1998) 4966
- (1998) J. Appl. Phys. , vol.84 , pp. 4966
- Vurgaftman, I.¹ Meyer, J.R.² Hoffman, C.A.³ Redfern, D.⁴ Antoszewski, J.⁵ Faraone, L.⁶ Lindemuth, J.R.⁷

15
- 33749159201
- Chen X.Y., and Shen W.Z. Phys. Rev. B 72 (2005) 035309
- (2005) Phys. Rev. B , vol.72 , pp. 035309
- Chen, X.Y.¹ Shen, W.Z.²

16
- 0031994210
- Look D.C., Reynolds D.C., Sizelove J.R., Jones R.L., Litton C.W., Cantwell G., and Harsch W.C. Solid State Commun. 105 (1998) 399
- (1998) Solid State Commun. , vol.105 , pp. 399
- Look, D.C.¹ Reynolds, D.C.² Sizelove, J.R.³ Jones, R.L.⁴ Litton, C.W.⁵ Cantwell, G.⁶ Harsch, W.C.⁷

17
- 33748536124
- Makino T., Tsukazaki A., Ohtomo A., Kawasaki M., and Koinuma H. Japan. J. Appl. Phys., Part 1 45 (2006) 6346
- (2006) Japan. J. Appl. Phys., Part 1 , vol.45 , pp. 6346
- Makino, T.¹ Tsukazaki, A.² Ohtomo, A.³ Kawasaki, M.⁴ Koinuma, H.⁵

18
- 33846986295
- Zhao J.L., Li X.M., Krtschil A., Krost A., Yu W.D., Zhang Y.W., Gu Y.F., and Gao X.D. Appl. Phys. Lett. 90 (2007) 062118
- (2007) Appl. Phys. Lett. , vol.90 , pp. 062118
- Zhao, J.L.¹ Li, X.M.² Krtschil, A.³ Krost, A.⁴ Yu, W.D.⁵ Zhang, Y.W.⁶ Gu, Y.F.⁷ Gao, X.D.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.