P-type behavior in In-N codoped ZnO thin films

Applied Physics Letters

Volumn 87, Issue 25, 2005, Pages 1-3

  Chen, L L ^a   Lu, J G ^a   Ye, Z Z ^a   Lin, Y M ^a   Zhao, B H ^a   Ye, Y M ^a   Li, J S ^a   Zhu, L P ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; HALL EFFECT; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS;

CODOPING; HALL EFFECT MEASUREMENTS; NITROGEN INCORPORATION; P-TYPE BEHAVIORS;

THIN FILMS;

EID: 29144526720     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2146309     Document Type: Article

References (14)

1. E. W. Wong and P. C. Searon, Appl. Phys. Lett. 74, 2939 (1999).
2. D. M. Bagnall, Y. F. Chen, Z. Zhu. T. Yao, S. Koyama, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997).
3. P. Yu, Z. K. Tang, G. K. L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, J. Cryst. Growth 184-185, 601 (1998).
4. M. H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, and P. D. Yang, Science 292, 1897 (2001).
5. A. Kobayashi, O. G. Sankey, and J. D. Dow, Phys. Rev. B 28, 946 (1983).
6. D. C. Look, D. C. Reynolds, C. W. Litton, R. L. Jones, D. B. Eason, and G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002).
7. L. G. Wang and A. Zunger, Phys. Rev. Lett. 90, 256401 (2003).
8. T. Yamamoto and H. Katayama-Yoshida, Jpn. J. Appl. Phys., Part 2 38, L166 (1999).
9. J. G. Lu, Z. Z. Ye, F. Zhuge, Y. J. Zeng, B. H. Zhao, and L. P. Zhu, Appl. Phys. Lett. 85, 3134 (2004).
10. M. Joseph, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2 38, L1205 (1999).
11. J. M. Bian, X. M. Li, X. D. Gao, W. D. Yu, and L. D. Chen, Appl. Phys. Lett. 84, 541 (2004).
12. S. B. Zhang, S.-H. Wei, and Y. F. Yan, Physica B 302-303, 135 (2001).
13. F. Zhuge, L. P. Zhu, Z. Z. Ye, D. W. Ma, J. G. Lu. J. Y. Huang, F. Z. Wang, and Z. G. Ji, Appl. Phys. Lett. 87, 092103 (2005).
14. T. Aoki, Y. Shimizu, A. Miyake, A. Nakamura, Y. Nakanishi, and Y. Hatanaka, Phys. Status Solidi B 229, 911 (2002).