Directional dependence of AlN intrinsic complex dielectric function, optical phonon lifetimes, and decay channels measured by polarized infrared reflectivity

Journal of Applied Physics

Volumn 106, Issue 2, 2009, Pages

  Kazan, M ^a   Pereira, S ^b   Correia, M R ^c   Masri, P ^d  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b UNIVERSITY OF AVEIRO   (Portugal)

^c UNIVERSITY OF AVEIRO   (Portugal)

^d UNIVERSITÉ MONTPELLIER 2   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALN; ALN SINGLE CRYSTALS; COMPLEX DIELECTRIC FUNCTIONS; CRYSTALLOGRAPHIC DIRECTIONS; CRYSTALLOGRAPHIC ORIENTATIONS; DECAY CHANNELS; DIELECTRIC CONSTANTS; DIELECTRIC PARAMETERS; DIRECTIONAL DEPENDENCE; EXPERIMENTAL ARRANGEMENT; HIGH QUALITY; HIGH-CRYSTALLINE QUALITY; HIGH-FREQUENCY DIELECTRICS; INFRARED REFLECTIVITY; INFRARED REFLECTIVITY MEASUREMENT; KRAMERS-KRONIG; LINEWIDTH BROADENING; LORENTZ OSCILLATOR; LOWER ENERGIES; MEASUREMENT TECHNIQUES; OPTICAL PHONONS; PHONON ENERGIES; PHONON LIFETIMES; PHONON-SCATTERING MECHANISMS; RAMAN MEASUREMENTS; SLIT WIDTH; WURTZITES;

CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; LIGHT TRANSMISSION; PERMITTIVITY; REFLECTION; SINGLE CRYSTALS; ZINC SULFIDE;

PHONONS;

EID: 68249135353     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3177323     Document Type: Article

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