메뉴 건너뛰기




Volumn 44, Issue 12, 2009, Pages 2319-2326

Simulation and testing of pollutant dispersion during preventive maintenance in a cleanroom

Author keywords

Airborne molecular contamination; Cleanroom; Gas sensors; Preventive maintenance

Indexed keywords

AIRBORNE MOLECULAR CONTAMINATION; DETECTION LIMITS; EMISSION SOURCES; EXPERIMENTAL DATA; EXPERIMENTAL VALUES; FOURIER TRANSFORM INFRARED SPECTROMETER; GAS CONCENTRATION; GAS SENSORS; MIXED MODELS; MONITORING SYSTEM; NUMERICAL RESULTS; POLLUTANT CONCENTRATION; POLLUTANT DISPERSIONS; PRODUCT YIELDS; REAL TIME; SEMICONDUCTOR FAB; SIMULATION AND TESTING; THREE-DIMENSIONAL NUMERICAL MODELS;

EID: 67651067963     PISSN: 03601323     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.buildenv.2009.03.018     Document Type: Article
Times cited : (14)

References (23)
  • 2
    • 0030177145 scopus 로고    scopus 로고
    • Airborne molecular contamination: cleanroom control strategies
    • Higley J.K., and Joffe M.A. Airborne molecular contamination: cleanroom control strategies. Solid State Technology 39 (1996) 211-212
    • (1996) Solid State Technology , vol.39 , pp. 211-212
    • Higley, J.K.1    Joffe, M.A.2
  • 3
    • 0035423936 scopus 로고    scopus 로고
    • The impact of airborne molecular base on DUV photoresists
    • Ruede D., Ercken M., and Borgers T. The impact of airborne molecular base on DUV photoresists. Solid State Technology 44 (2001) 63-70
    • (2001) Solid State Technology , vol.44 , pp. 63-70
    • Ruede, D.1    Ercken, M.2    Borgers, T.3
  • 4
    • 0029530330 scopus 로고
    • A semiconductor device manufacturer's efforts controlling and evaluating atmospheric pollution
    • Kanzawa K, Kitano J. A semiconductor device manufacturer's efforts controlling and evaluating atmospheric pollution. IEEE/SEMI Advanced Semiconductor Manufacturing Conference; 1995. p.:190-193.
    • (1995) IEEE/SEMI Advanced Semiconductor Manufacturing Conference , pp. 190-193
    • Kanzawa, K.1    Kitano, J.2
  • 8
    • 67651073025 scopus 로고    scopus 로고
    • Ventilation control of air pollutant during preventive maintenance of a metal etcher in semiconductor industry
    • Chien C.L., Tsai C.J., Ku K.W., and Li S.N. Ventilation control of air pollutant during preventive maintenance of a metal etcher in semiconductor industry. Aerosol and Air Quality Research 7 4 (2007) 469-488
    • (2007) Aerosol and Air Quality Research , vol.7 , Issue.4 , pp. 469-488
    • Chien, C.L.1    Tsai, C.J.2    Ku, K.W.3    Li, S.N.4
  • 9
    • 43249103799 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors ITRS
    • International Technology Roadmap for Semiconductors (ITRS). Yield Enhancement; 2007, pp. 1-44. http://www.itrs.net/Links/2007ITRS/2007_Chapters/2007_Yield.pdf.
    • (2007) Yield Enhancement , pp. 1-44
  • 11
    • 33947578109 scopus 로고    scopus 로고
    • Characterization of minienvironments in a clean room: Design characteristics and environmental performance
    • Xu T. Characterization of minienvironments in a clean room: Design characteristics and environmental performance. Building and Environment 42 (2007) 2993-3000
    • (2007) Building and Environment , vol.42 , pp. 2993-3000
    • Xu, T.1
  • 12
    • 33845579441 scopus 로고    scopus 로고
    • Dispersion of gas pollutant in a fan-filter-unit (FFU) cleanroom
    • Chen S.C., Tsai C.J., Li S.N., and Shih H.Y. Dispersion of gas pollutant in a fan-filter-unit (FFU) cleanroom. Building and Environment 42 (2007) 1902-1912
    • (2007) Building and Environment , vol.42 , pp. 1902-1912
    • Chen, S.C.1    Tsai, C.J.2    Li, S.N.3    Shih, H.Y.4
  • 13
    • 0042887652 scopus 로고    scopus 로고
    • Comparing zonal and CFD model predictions of isothermal indoor airflows to experimental data
    • Mora L., Gadgil A.J., and Wurtz E. Comparing zonal and CFD model predictions of isothermal indoor airflows to experimental data. Indoor Air 13 (2003) 77-85
    • (2003) Indoor Air , vol.13 , pp. 77-85
    • Mora, L.1    Gadgil, A.J.2    Wurtz, E.3
  • 14
    • 34249709479 scopus 로고    scopus 로고
    • Identification of contaminant sources in enclosed environments by inverse CFD modeling
    • Zhang T.F., and Chen Q. Identification of contaminant sources in enclosed environments by inverse CFD modeling. Indoor Air 17 (2007) 167-177
    • (2007) Indoor Air , vol.17 , pp. 167-177
    • Zhang, T.F.1    Chen, Q.2
  • 15
    • 43449086388 scopus 로고    scopus 로고
    • Large eddy simulation and zonal modeling of human-induced contaminant transport
    • Choi J.I., and Edwards J.R. Large eddy simulation and zonal modeling of human-induced contaminant transport. Indoor Air 18 (2008) 233-249
    • (2008) Indoor Air , vol.18 , pp. 233-249
    • Choi, J.I.1    Edwards, J.R.2
  • 16
    • 0344676397 scopus 로고    scopus 로고
    • Quality control of computational fluid dynamics in indoor environments
    • Sørensen D.N., and Nielsen P.V. Quality control of computational fluid dynamics in indoor environments. Indoor Air 13 (2003) 2-17
    • (2003) Indoor Air , vol.13 , pp. 2-17
    • Sørensen, D.N.1    Nielsen, P.V.2
  • 17
    • 34249952047 scopus 로고    scopus 로고
    • The development of fan filter unit with flow rate feedback control in a cleanroom
    • Chen J.J., Lan C.H., Jeng M.S., and Xu T. The development of fan filter unit with flow rate feedback control in a cleanroom. Building and Environment 42 (2007) 3556-3561
    • (2007) Building and Environment , vol.42 , pp. 3556-3561
    • Chen, J.J.1    Lan, C.H.2    Jeng, M.S.3    Xu, T.4
  • 18
    • 67650079827 scopus 로고    scopus 로고
    • An innovative method for dynamic characterization of fan filter unit operation
    • Xu T. An innovative method for dynamic characterization of fan filter unit operation. Journal of the IEST 50 2 (2007) 85-97
    • (2007) Journal of the IEST , vol.50 , Issue.2 , pp. 85-97
    • Xu, T.1
  • 19
    • 43949143187 scopus 로고    scopus 로고
    • Characterization of minienvironments in a cleanroom: Assessing energy performance and its implications
    • Xu T. Characterization of minienvironments in a cleanroom: Assessing energy performance and its implications. Building and Environment 43 (2008) 1545-1552
    • (2008) Building and Environment , vol.43 , pp. 1545-1552
    • Xu, T.1
  • 23
    • 34547751838 scopus 로고    scopus 로고
    • Real-time monitors: Review and lithography applications
    • 27th edition, pp
    • Robin Danfelt, Real-time monitors: Review and lithography applications. Semiconductor fabtech, 27th edition, pp. 100-106. http://www.fabtech.org.
    • Semiconductor fabtech , pp. 100-106
    • Danfelt, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.