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Volumn 5265, Issue , 2004, Pages 24-32

3-D precision surface measurement by dynamic structured light

Author keywords

3D measurement; Dynamic structured light; Reverse engineering; Surface profile

Indexed keywords

AIRCRAFT; APPROXIMATION THEORY; CAMERAS; COMPUTER VISION; CONTROL SYSTEMS; COST EFFECTIVENESS; INSPECTION; LIGHT EMITTING DIODES; PROJECTION SYSTEMS; REVERSE ENGINEERING; SURFACE MEASUREMENT;

EID: 2142828095     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.514442     Document Type: Conference Paper
Times cited : (6)

References (2)
  • 1
    • 2142711624 scopus 로고    scopus 로고
    • Full-field surface profiling using dynamic projected grids
    • Beeson, R. J., "Full-field surface profiling using dynamic projected grids," SPIE Proceedings Vol. 3204, 1997, pp 68-73.
    • (1997) SPIE Proceedings , vol.3204 , pp. 68-73
    • Beeson, R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.