Molecular mechanisms of electron-induced cross-linking in aromatic SAMs

Langmuir

Volumn 25, Issue 13, 2009, Pages 7342-7352

  Turchanin, Andrey ^a   Käfer, Daniel ^b   El Desawy, Mohamed ^a   Wöll, Christof ^b   Witte, Gregor ^b,c   Gölzhäuser, Armin ^a  

^a BIELEFELD UNIVERSITY   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; CARBON NANOSHEETS; CROSS-LINKED FILMS; ELECTRON DOSE; EXPERIMENTAL DATA; HIGH DOSE; INTERMOLECULAR CROSSLINKING; MOLECULAR MECHANISM; MOLECULAR THICKNESS; QUANTUM CHEMICAL CALCULATIONS; ROOM TEMPERATURE; SAMS; STERIC REASONS; STRUCTURAL TRANSFORMATION; THERMAL DESORPTION SPECTRA; THERMAL STABILITY; UV PHOTOELECTRON SPECTROSCOPY;

AROMATIC COMPOUNDS; CARBONIZATION; CROSSLINKING; ELECTRON IRRADIATION; ELECTRON SPECTROSCOPY; ELECTRONS; MECHANICAL STABILITY; MECHANISMS; MOLECULAR SPECTROSCOPY; NANOSHEETS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; POWER SUPPLY CIRCUITS; QUANTUM CHEMISTRY; QUENCHING; SELF ASSEMBLED MONOLAYERS; SPECTRUM ANALYSIS; SULFUR; SURFACE CHEMISTRY; THERMAL DESORPTION; THERMODYNAMIC STABILITY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 67650094301     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la803538z     Document Type: Article

References (67)

1. Geyer, W.; Stadler, V.; Eck, W.; Zharnikov, M.; Gölzhäuser, A.; Grunze, M. Appl. Phys. Lett. 1999, 75, 2401-2403.
2. Turchanin, A.; Schnietz, M.; El-Desawy, M.; Solak, H. H.; David, C.; Gölzhäuser, A. Small 2007, 3, 2114-2119.
3. Gölzhäuser, A.; Geyer, W.; Stadler, V.; Eck, W.; Grunze, M.; Edinger, K.; Weimann, T.; Hinze, P. J. Vac. Sci. Technol. B 2000, 18, 3414-3418.
4. Kaltenpoth, G.; Völkel, B.; Nottbohm, C. T.; Gölzhäuser, A.; Buck, M. J. Vac. Sci. Technol. B 2002, 20, 2734-2738.
5. Turchanin, A.; Tinazli, A.; El-Desawy, M.; Grossmann, H.; Schnietz, M.; Solak, H. H.; Tampé, R.; Gölzhäuser, A. Adv. Mater. 2008, 20, 471-477.
6. Shon, Y. S.; Lee, T. R. J. Phys. Chem. B 2000, 104, 8192-8200.
7. Clegg, R. S.; Reed, S. M.; Hutchison, J. E. J. Am. Chem. Soc. 1998, 120, 2486-2487.
8. Jennings, G. K.; Laibinis, P. E. J. Am. Chem. Soc. 1997, 119, 5208-5214.
9. Kim, T.; Chan, K. C.; Crooks, R. M. J. Am. Chem. Soc. 1997, 119, 189-193.
10. Sabatani, E.; Cohenboulakia, J.; Bruening, M.; Rubinstein, I. Langmuir 1993, 9, 2974-2981.
11. Bain, C. D.; Troughton, E. B.; Tao, Y. T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
12. Vollmer, S.; Witte, G.; Wöll. C. Langmuir 2001, 17, 7560-7565.
13. Turchanin, A.; El-Desawy, M.; Gölzhäuser, A. Appl. Phys. Lett. 2007, 90, 053102.
14. Eck, W.; Küller, A.; Grunze, M.; Völkel, B.; Gölzhäuser, A. Adv. Mater. 2005, 17, 2583-2587.
15. Tai, Y.; Shaporenko, A.; Noda, H.; Grunze, M.; Zharnikov, M. Adv. Mater. 2005, 17, 1745-1749.
16. Nottbohm, C.; Turchanin, A.; Gölzhäuser, A. Z. Phys. Chem. 2008, 222, 917-926.
17. Nottbohm, C. T.; Beyer, A.; Sologubenko, A. S.; Ennen, I.; Hütten, A.; Rösner, H.; Eck, W.; Mayer, J.; A, G. Ultramicroscopy 2008, 108, 885-892.
18. Lercel, M. J.; Craighead, H. G.; Parikh, A. N.; Seshadri, K.; Allara, D. L. Appl. Phys. Lett. 1996, 68, 1504-1506.
19. Gölzhäuser, A.; Eck, W.; Geyer, W.; Stadler, V.; Weimann, T.; Hinze, P.; Grunze, M. Adv. Mater. 2001, 13, 806-809.
20. Küller, A.; Eck, W.; Stadler, V.; Geyer, W.; Gölzhäuser, A. Appl. Phys. Lett. 2003, 82, 3776-3778.
21. Schmelmer, U.; Jordan, R.; Geyer, W.; Eck, W.; Gölzhäuser, A.; Grunze, M.; Ulman, A. Angew. Chem. Int. Ed. 2003, 42, 559-563.
22. Schmelmer, U.; Paul, A.; Küller, A.; Steenackers, M.; Ulman, A.; Grunze, M.; Gölzhäuser, A.; Jordan, R. Small 2007, 3, 459-465.
23. Zharnikov, M.; Grunze, M. J. Vac. Sci. Technol. B 2002, 20, 1793-1807.
24. Eck, W.; Stadler, V.; Geyer, W.; Zharnikov, M.; Gölzhäuser, A.; Grunze, M. Adv. Mater. 2000, 12, 805-808.
25. Frey, S.; Rong, H. T.; Heister, K.; Yang, Y. J.; Buck, M.; Zharnikov, M. Langmuir 2002, 18, 3142-3150.
26. Briggs, D.; Grant, J. T. Surface Analyses by Auger and X-Ray Photoeiectron Spectroscopy; SurfaceSpectra Limited: Chichester, 2003.
27. Heister, K.; Zharnikov, M.; Grunze, M.; Johansson, L. S. O. J. Phys. Chem. B 2001, 105, 4058-4061.
28. Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y. T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152-7167.
29. Gries, W. H. Surf. Interface Anal. 1996, 24, 38-50.
30. NIST X-ray Photoelectron Spectroscopy Database 20, (Version 3.4, Web Version, 2003).
31. Whelan, C. M.; Barnes, C. J.; Gregoire, C.; Pireaux, J. J. Surf. Sci. 2000, 454, 67-72.
32. Heister, K.; Zharnikov, M.; Grunze, M.; Johansson, L. S. O.; Ulman, A. Langmuir 2001, 17, 8-11.
33. Küller, A.; El-Desawy, M. A.; Stadler, V.; Geyer, W.; Eck, W.; Gölzhäuser, A. J. Vac. Sci. Technol. B 2004, 22, 1114-1117.
34. Minkov, I.; Gel'mukhanov, F.; Agren, H.; Friedlein, R.; Suess, C.; Salaneck, W. R. J. Phys. Chem. A 2005, 109, 1330-1336.
35. Zharnikov, M.; Grunze, M. J. Phys.: Condens. Matter 2001, 13, 11333-11365.
36. Stöhr, J. NEXAFS Spectroscopy; Springer: Berlin, 1992.
37. Rong, H. T.; Frey, S.; Yang, Y. J.; Zharnikov, M.; Buck, M.; Wiihn, M.; Wöll, C.; Helmchen, G. Langmuir 2001, 17, 1582-1593.
38. Ballav, N.; Schupbach, B.; Dethloff, O.; Feulner, P.; Terfort, A.; Zharnikov, M. J. Am. Chem. Soc. 2007, 129, 15416.
39. Kyotani, T.; Sonobe, N.; Tomita, A. Nature (London) 1988, 331, 331-333.
40. Käfer, D.; Witte, G.; Cyganik, P.; Terfort, A.; Wöll, C. J. Am. Chem. Soc. 2006, 128, 1723-1732.
41. Käfer, D.; Bashir, A.; Witte, G. J. Phys. Chem. C 2007, 111, 10546-10551.
42. Massalski, T. B. Binary Alloy Phase Diagrams, 2nd ed.; ASM International: Materials Park, OH, 1990.
43. Hänel, K.; Söhnchen, S.; Lukas, S.; Beernink, G.; Birkner, A.; Strunskus, T.; Witte, G.; Wöll, C. J. Mater. Res. 2004, 19, 2049-2056.
44. Käfer, D.; Ruppel, L.; Witte, G. Phys. Rev. B 2007, 75.
45. Müllegger, S.; Hanel, K.; Strunskus, T.; Wöll, C.; Winkler, A. Chem-PhysChem 2006, 7, 2552-2558.
46. Roller, G.; Berkebile, S.; Ivanco, J.; Netzer, F. P.; Ramsey, M. G. Surf. Sci. 2007, 601, 5683-5689.
47. Heimel, G.; Romaner, L.; Bredas, J. L.; Zojer, E. Lansmuir 2008, 24, 474-482.
48. Heimel, G.; Romaner, L.; Zojer, E.; Bredas, J. L. Nano Lett. 2007, 7, 932-940.
49. Palmer, R. E.; Rous, P. J. Rev. Mod. Phys. 1992, 64, 383-440.
50. Bass, A. D.; Sanche, L. In Charged Particle and Photon Interactions with Matter, Mozunder, A., Hatano, Y., Eds.; Marcel Dekker, Inc.: New York, 2004; pp 207-257.
51. Illenberger, E. Chem. Rev. 1992, 92, 1589-1609.
52. Azzam, W.; Fuxen, C., Birkner, A.; Rong, H. T.; Buck, M.; Wöll, C. Langmuir 2003, 19, 4958-4968.
53. Hüfner, S. Photoelectron Spectroscopy, Principles and Applications; 3rd ed.; Springer: Berlin, 2003.
54. Caruso, A. N.; Rajesh, R.; Gallup, G.; Redepenning, J.; Dowben, P. A. J. Phys.: Condens. Matter 2004, 16, 845-860.
55. Feng, D. Q.; Wisbey, D.; Losovyj, Y. B.; Tai, Y.; Zharnikov, M.; Dowben, P. A. Phys. Rev. B 2006, 74.
56. Bashir, A.; Käfer, D.; Müller, J.; Wöll, C., Terfort, A.; Witte, G. Angew. Chem., Int. Ed. 2008, 108, 3750-3764.
57. Cyganik, P.; Vandeweert, E.; Postawa, Z.; Bastiaansen, J.; Vervaecke, F.; Lievens, P.; Silverans, R. K.; Winograd, N. J. Phys. Chem. B 2005, 109, 5085-5094.
58. Charbonneau, G. P.; Delugeard, Y. Acta Crystallogr., Sect. B: Struct. Sci. 1977, 33, 1586-1588.
59. Edinger, K.; Grunze, M.; Wöll, C. Ber. Bunsen-Ges. Phys. Chem. 1997, 101, 1811-1815.
60. Yang, G. H.; Liu, G. Y. J. Phys. Chem. B 2003, 107, 8746-8759.
61. Maksymovych, P.; Sorescu, D. C.; Yates, J. T. Phys. Rev. Lett. 2006, 97.
62. Cossaro, A.; Mazzarello, R.; Rousseau, R.; Casalis, L.; Verdini, A.; Kohlmeyer, A.; Floreano, L.; Scandolo, S.; Morgante, A.; Klein, M. L.; Scoles, G. Science 2008, 321, 943-946.
63. Olsen, C.; Rowntree, P. A. J. Chem. Phys. 1998, 108, 3750-3764.
64. Illenberger, E. Surf. Sci. 2003, 528, 67-77.
65. Völkel, B.; Gölzhäuser, A.; Müller, H. U.; David, C.; Grunze, M. J. Vac. Sci. Technol. B 1997, 15, 2877-2881.
66. Tobita, S.; Meinke, M.; Illenberger, E.; Christophorou, L. G.; Baumgartel, H.; Leach, S. Chem. Phys. 1992, 161, 501-508.
67. Turchanin, A.; Beyer, A.; Nottbohm, C. T.; Zhang, X.; Stosch, R.; Sologubenko, A.; Mayer, J.; Hinze, P.; Weimann, T.; Gölzhäuser, A. Adv. Mater. 2009, 21, 1233-1237.