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Volumn 206, Issue 6, 2009, Pages 1245-1249

"Etching under the corner" - Inclined macropores by reactive ion etching

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC TEMPERATURES; DEEP REACTIVE ION ETCHING; ETCHED PORES; ETCHING PARAMETERS; MACROPORE FORMATION; MACROPORES; NONUNIFORMITY; SILICON OXIDE LAYERS;

EID: 67649972126     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881066     Document Type: Article
Times cited : (3)

References (16)
  • 1
    • 0003735093 scopus 로고
    • World Scientific, Singapore
    • U. Gösele and V. Lehmann, Porous Silicon (World Scientific, Singapore, 1994), pp. 17-39.
    • (1994) Porous Silicon , pp. 17-39
    • Gösele, U.1    Lehmann, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.