Compositional contrast of uncoated fungal spores and stained section-face by low-loss backscattered electron imaging

Micron

Volumn 40, Issue 7, 2009, Pages 724-729

  Kim, Ki Woo ^a   Jaksch, Heiner ^b  

^a Seoul National University   (South Korea)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

Backscattered electron; Contrast; Low loss BSE; Reflection electron microscopy; Section face; Spore

Indexed keywords

BACKSCATTERED ELECTRON; CONTRAST; LOW-LOSS BSE; REFLECTION ELECTRON MICROSCOPY; SECTION-FACE; SPORE;

BACKSCATTERING; BLIND SOURCE SEPARATION; CARRIER CONCENTRATION; CELL MEMBRANES; ELECTRON DENSITY MEASUREMENT; ELECTRON MICROSCOPES; ELECTRON OPTICS; ELECTRON SCATTERING; EPOXY RESINS; FIELD EMISSION; FIELD EMISSION MICROSCOPES; LENSES; OPTICAL INSTRUMENTS; RESINS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; URANIUM;

ELECTRONS;

CONTRAST MEDIUM;

ARTICLE; ASCOMYCETES; COMPARATIVE STUDY; FUNGUS HYPHAE; FUNGUS SPORE; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; STAINING; ULTRASTRUCTURE;

CONTRAST MEDIA; HYPHAE; HYPOCREALES; MICROSCOPY, ELECTRON, SCANNING; SPORES, FUNGAL; STAINING AND LABELING;

BACTERIA (MICROORGANISMS); FUNGI;

EID: 67649670113     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2009.05.001     Document Type: Article

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