Atomic force microscopy for direct imaging and nanoscale morphometry of the rice false smut fungus Ustilaginoidea virens

Journal of Phytopathology

Volumn 154, Issue 11-12, 2006, Pages 751-754

  Kim, K W ^a  

^a Seoul National University   (South Korea)

Author keywords

AFM; Nanobiology; Ornamentation; Roughness; Surface parameter

Indexed keywords

ATOMIC FORCE MICROSCOPY; FUNGUS; IMAGING METHOD; MORPHOMETRY; SPORE;

FUNGI; USTILAGINOIDEA VIRENS;

EID: 33751013026     PISSN: 09311785     EISSN: 14390434     Source Type: Journal    
DOI: 10.1111/j.1439-0434.2006.01175.x     Document Type: Article

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