New detection system for GEMINI

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1372-1373

  Steigerwald, M D G ^b   Arnold, R ^b   Bihr, J ^b   Drexel, V ^b   Jaksch, H ^b   Preikszas, D ^b   Vermeulen, J P ^a  

^a LEO GmbH   (Germany)

^b NONE

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EID: 4544234168     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604884083     Document Type: Conference Paper

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