Direct whole-mount imaging of fungal spores by energy-filtering transmission electron microscopy

Micron

Volumn 40, Issue 2, 2009, Pages 279-283

  Kim, Ki Woo ^a  

^a Seoul National University   (South Korea)

Author keywords

Contrast; Energy filtering; Image; Plasmon loss; Spore

Indexed keywords

COPPER; ELECTRON MICROSCOPES; ELECTRONS; MICROSCOPIC EXAMINATION; MOUNTINGS; TWO DIMENSIONAL;

CELL WALLS; CONTRAST; COPPER GRIDS; DISTILLED WATERS; ELECTRON DENSITIES; ENERGY-FILTERING; FILTERED IMAGES; FUNGAL SPORES; HIGHER RESOLUTIONS; IMAGE; LIGHT MICROSCOPIES; SCANNING ELECTRONS; SPATIAL RESOLUTIONS; SPORE; STRUCTURAL DETAILS; TRANSMISSION ELECTRONS;

IMAGE ENHANCEMENT;

ARTICLE; ASCOMYCETES; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; EVALUATION; FUNGUS SPORE; ISOLATION AND PURIFICATION; METHODOLOGY; MICROBIOLOGY; OAK; PENICILLIUM; PHYSIOLOGY; PLANT DISEASE; RICE; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

HYPOCREALES; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ENERGY-FILTERING TRANSMISSION ELECTRON; ORYZA SATIVA; PENICILLIUM; PLANT DISEASES; QUERCUS; SPORES, FUNGAL;

BACTERIA (MICROORGANISMS); FUNGI; PENICILLIUM; USTILAGINOIDEA VIRENS;

EID: 56949107593     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2008.07.005     Document Type: Article

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