SRAM supply voltage scaling: a reliability perspective

Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Volumn , Issue , 2009, Pages 782-787

  Kumar, Animesh ^a   Rabaey, Jan ^a   Ramchandran, Kannan ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Error correction code; Leakage; Leakage power; Low power; Low voltage; Parametric failures; Soft errors; SRAM; Voltage scaling

Indexed keywords

ERROR-CORRECTION CODE; LEAKAGE; LEAKAGE-POWER; LOW-POWER; LOW-VOLTAGE; PARAMETRIC FAILURES; SOFT-ERRORS; SRAM; VOLTAGE SCALING;

BIT ERROR RATE; COST FUNCTIONS; DATA COMMUNICATION EQUIPMENT; ERROR CORRECTION; PROBABILITY; PROBABILITY DENSITY FUNCTION; RELIABILITY; SET THEORY; STATIC RANDOM ACCESS STORAGE;

DATA REDUCTION;

EID: 67649638002     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2009.4810392     Document Type: Conference Paper

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