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Volumn 20, Issue 26, 2009, Pages

Towards an understanding of the atomic scale magnetic contrast formation in NC-AFM: A tip material dependent MExFM study on NiO(001)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC RESOLUTION; ATOMIC SCALE; CHEMICAL CONTRAST; COATED TIPS; FE-COATED; FORCE MICROSCOPY; MAGNETIC CONTRAST; MAGNETIC EXCHANGE; MAGNETIC SIGNALS; OUT-OF-PLANE; SAMPLE SYSTEM;

EID: 67649306851     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264017     Document Type: Article
Times cited : (11)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.