Functional characterization of 3D-DDTC detectors fabricated at FBK-irst

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2008, Pages 2721-2726

  Zoboli, Andrea ^a   Boscardin, Maurizio ^b   Bosisio, Luciano ^c   Dalla Betta, Gian Franco ^a   Eckert, Simon ^d   Kiihn, Susanne ^d   Piemonte, Claudio ^b   Parzefall, Ulrich ^d   Ronchin, Sabina ^b   Zorzi, Nicola ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b FONDAZIONE BRUNO KESSLER   (Italy)

^c UNIVERSITY OF TRIESTE   (Italy)

^d UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEFORE AND AFTER; FLUENCES; FUNCTIONAL CHARACTERIZATION; INFRARED LASER; MICROSTRIP SENSORS; SHORT DISTANCES; WAFER SURFACE; WAFER THICKNESS;

MICROSTRIP DEVICES; THREE DIMENSIONAL;

SENSORS;

EID: 67649233859     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774937     Document Type: Conference Paper

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