New developments on 3D detectors at IRST

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 983-987

  Dalla Betta, Gian Franco ^a,b   Boscardin, Maurizio ^c   Bosisio, Luciano ^d,e   Piemonte, Claudio ^c   Ronchin, Sabina ^c   Zoboli, Andrea ^a,b   Zorzi, Nicola ^c  

^a IEEE

^b UNIVERSITY OF TRENTO   (Italy)

^c ITC IRST   (Italy)

^d SEZIONE DI TRIESTE   (Italy)

^e UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; FABRICATION; MEDICAL IMAGING; SEMICONDUCTING SILICON COMPOUNDS; SILICON DETECTORS; SILICON WAFERS;

3D DETECTORS; CHARGE COLLECTION PROPERTIES; DETECTOR CONCEPTS; FABRICATION PROCESSES; NEW DEVELOPMENTS; PIXEL DETECTORS; SHORT DISTANCES; SILICON RADIATION DETECTORS; SIMULATION RESULTS; STRIP DETECTORS; TEST STRUCTURES; WAFER THICKNESSES;

RADIATION DETECTORS;

EID: 48349131456     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437180     Document Type: Conference Paper

References (11)

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