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Volumn 479, Issue 1-2, 2009, Pages 741-745
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Properties of W incorporated diamond-like carbon films prepared by pulsed-laser deposition
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Author keywords
Coating materials; Microstructure; Vapor deposition; X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPES;
COATING MATERIALS;
COMPLEX INDEX OF REFRACTIONS;
DEPOSITION TIME;
EXTINCTION CO-EFFICIENT;
PULSED-LASER DEPOSITIONS;
RAMAN SPECTRUM;
SURFACE IMAGES;
W INCORPORATED DIAMOND-LIKE CARBON FILMS;
X-RAY DIFFRACTOMETERS;
ATOMIC SPECTROSCOPY;
CHEMICAL VAPOR DEPOSITION;
DIAMOND FILMS;
DIAMOND LIKE CARBON FILMS;
DIAMONDS;
DIFFRACTION;
FILM PREPARATION;
MICROSTRUCTURE;
PHOTORESISTS;
PLATING;
PULSED LASER DEPOSITION;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
REFRACTIVE INDEX;
SURFACE ROUGHNESS;
TUNGSTEN COMPOUNDS;
VAPORS;
X RAY DIFFRACTION;
CARBON FILMS;
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EID: 67349285880
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.01.044 Document Type: Article |
Times cited : (18)
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References (34)
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