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Volumn 86, Issue 11, 2005, Pages 1-3
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Unusual stress behavior in W-incorporated hydrogenated amorphous carbon films
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
COMPRESSIVE STRESS;
COMPUTATIONAL METHODS;
CONCENTRATION (PROCESS);
HIGH RESOLUTION ELECTRON MICROSCOPY;
ION BEAM ASSISTED DEPOSITION;
STRESS ANALYSIS;
SYNTHESIS (CHEMICAL);
TRANSMISSION ELECTRON MICROSCOPY;
TUNGSTEN;
AMORPHOUS CARBON FILMS;
CARBON MATRIX;
GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD);
HYBRID DEPOSITION;
AMORPHOUS FILMS;
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EID: 17944379512
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1883328 Document Type: Article |
Times cited : (51)
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References (16)
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