Determining orientational structure of diamondoid thiols attached to silver using near-edge X-ray absorption fine structure spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 172, Issue 1-3, 2009, Pages 69-77

  Willey, Trevor M ^a   Lee, Jonathan R I ^a   Fabbri, Jason D ^b   Wang, Dongbo ^c   Nielsen, Michael H ^d   Randel, Jason C ^b   Schreiner, Peter R ^e   Fokin, Andrey A ^e   Tkachenko, Boryslav A ^e   Fokina, Natalie A ^e   Dahl, Jeremy E P ^f   Carlson, Robert M K ^f   Terminello, Louis J ^a   Melosh, Nicholas A ^b   van Buuren, Tony ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e JUSTUS LIEBIG UNIVERSITY   (Germany)

^f Chevron   (United States)

Author keywords

Diamondoids; Molecular electronics; Nanodiamond; NEXAFS; Self assembled monolayers; Thiols

Indexed keywords

CAGE STRUCTURES; DIAMONDOID; DIAMONDOIDS; FLEXIBLE PLATFORMS; HYDROCARBON MOLECULES; METAL SUBSTRATE; MOLECULAR ORIENTATIONAL; MOLECULAR TILT; MONOLAYER STRUCTURES; NANODIAMOND; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEW CLASS; NEXAFS; NEXAFS SPECTROSCOPY; ORIENTATIONAL STRUCTURE; POSITIONAL ISOMERS; RIGID MOLECULES; SILVER SUBSTRATE; STRUCTURAL ISOMERS; THIOLS;

ABSORPTION; ABSORPTION SPECTROSCOPY; CHEMISORPTION; DIAMONDS; ELECTRON ENERGY LEVELS; HYDROCARBONS; ISOMERS; MOLECULAR ELECTRONICS; MOLECULAR ORIENTATION; ORGANIC POLYMERS; SILVER; SURFACE PROPERTIES; TRACE ANALYSIS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

SELF ASSEMBLED MONOLAYERS;

EID: 67349182090     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.03.011     Document Type: Article

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