메뉴 건너뛰기




Volumn 32, Issue 2, 2009, Pages 65-73

Nonconductive films (NCFs) with multifunctional epoxies and silica fillers for reliable NCFs flip chip on organic boards (FCOBs)

Author keywords

Electroplated Au bump, glass transition temperature (Tg); Multifunctional epoxy; Nonconductive films; Silica fillers; Stud Au bump; Thermal cycling reliability; Thermomechanical properties

Indexed keywords

ELECTROPLATED AU BUMP, GLASS TRANSITION TEMPERATURE (TG); MULTIFUNCTIONAL EPOXY; NONCONDUCTIVE FILMS; SILICA FILLERS; STUD AU BUMP; THERMAL CYCLING RELIABILITY; THERMOMECHANICAL PROPERTIES;

EID: 67349107168     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2009.2015287     Document Type: Article
Times cited : (3)

References (13)
  • 1
    • 22944446769 scopus 로고    scopus 로고
    • Thermal cycling reliability and delamination of anisotropic conductive adhesives flip chip on organic substrates with emphasis on the thermal deformation
    • W. S. Kwon et al., "Thermal cycling reliability and delamination of anisotropic conductive adhesives flip chip on organic substrates with emphasis on the thermal deformation," ASME Trans-J. Electron. Packag., vol. 127, no. 2, pp. 86-90, 2005.
    • (2005) ASME Trans-J. Electron. Packag , vol.127 , Issue.2 , pp. 86-90
    • Kwon, W.S.1
  • 2
    • 0003512080 scopus 로고    scopus 로고
    • Conductive Adhesive for Electronics Packaging
    • U.K, Electrochemical Publications
    • J. Liu, Conductive Adhesive for Electronics Packaging. Isle of Man, U.K.: Electrochemical Publications, 1999, pp. 12-13.
    • (1999) Isle of Man , pp. 12-13
    • Liu, J.1
  • 3
    • 31544466522 scopus 로고    scopus 로고
    • Recent advances on anisotropic conductive adhesives (ACAs) for flat panel displays and semiconductor packaging applications
    • M. J. Yim et al., "Recent advances on anisotropic conductive adhesives (ACAs) for flat panel displays and semiconductor packaging applications," Int. J. Adhesion Adhesives, vol. 26, no. 5, pp. 304-313, 2006.
    • (2006) Int. J. Adhesion Adhesives , vol.26 , Issue.5 , pp. 304-313
    • Yim, M.J.1
  • 4
    • 33748532173 scopus 로고    scopus 로고
    • Evaluation of the delamination in a flip chip using anisotropic conductive adhesive films under moisture/reflow sensitivity test
    • Sep
    • T. Ikeda et al., "Evaluation of the delamination in a flip chip using anisotropic conductive adhesive films under moisture/reflow sensitivity test," IEEE Trans. Compon. Packag. Technol., vol. 29, no. 3, pp. 551-559, Sep. 2006.
    • (2006) IEEE Trans. Compon. Packag. Technol , vol.29 , Issue.3 , pp. 551-559
    • Ikeda, T.1
  • 5
    • 0035279926 scopus 로고    scopus 로고
    • Effect of nonconducting filler additions on ACA properties and the reliability of ACA flip-chip on organic substrates
    • Mar
    • M. J. Yim et al., "Effect of nonconducting filler additions on ACA properties and the reliability of ACA flip-chip on organic substrates," IEEE Trans. Compon. Packag. Technol., vol. 24, no. 1, pp. 24-32, Mar. 2001.
    • (2001) IEEE Trans. Compon. Packag. Technol , vol.24 , Issue.1 , pp. 24-32
    • Yim, M.J.1
  • 6
    • 84889476995 scopus 로고    scopus 로고
    • New York: Wiley-Interscience, p
    • S. Ganesan et al., Lead-Free Electronics. New York: Wiley-Interscience, p. 437.
    • Lead-Free Electronics , pp. 437
    • Ganesan, S.1
  • 7
    • 4344624100 scopus 로고    scopus 로고
    • Development and reliability of non-conductive adhesive flip-chip packages
    • L. K. Teh et al., "Development and reliability of non-conductive adhesive flip-chip packages," Thin Solid Films, vol. 462-463, pp. 446-453, 2004.
    • (2004) Thin Solid Films , vol.462-463 , pp. 446-453
    • Teh, L.K.1
  • 8
    • 10444219773 scopus 로고    scopus 로고
    • Some characteristics of anisotropic conductive and non-conductive adhesive flip chip on flex interconnections
    • J. F. J. M. Caers et al., "Some characteristics of anisotropic conductive and non-conductive adhesive flip chip on flex interconnections," J. Semicond. Technol. Sci., vol. 3, no. 3, pp. 122-131, 2003.
    • (2003) J. Semicond. Technol. Sci , vol.3 , Issue.3 , pp. 122-131
    • Caers, J.F.J.M.1
  • 9
    • 4444305289 scopus 로고    scopus 로고
    • Effects of silica filler and diluent on material properties and reliability of nonconductive pastes (NCPs) for flip-chip applications
    • Sep
    • K. W. Jang et al., "Effects of silica filler and diluent on material properties and reliability of nonconductive pastes (NCPs) for flip-chip applications," IEEE Trans Compon. Packag. Technol., vol. 27, no. 3, pp. 608-615, Sep. 2004.
    • (2004) IEEE Trans Compon. Packag. Technol , vol.27 , Issue.3 , pp. 608-615
    • Jang, K.W.1
  • 10
    • 0003425844 scopus 로고
    • London, U.K, Chapman & Hall
    • U. W. Gedde, Polymer Physics. London, U.K.: Chapman & Hall, 1995, pp. 78-81.
    • (1995) Polymer Physics , pp. 78-81
    • Gedde, U.W.1
  • 11
    • 0037048577 scopus 로고    scopus 로고
    • Combined effects of silica filler and its interface in epoxy resin
    • H. Wang et al., "Combined effects of silica filler and its interface in epoxy resin," Acta Mater., vol. 50, no. 17, pp. 4369-4377, 2002.
    • (2002) Acta Mater , vol.50 , Issue.17 , pp. 4369-4377
    • Wang, H.1
  • 12
    • 10444278084 scopus 로고    scopus 로고
    • The effect of Tg on thermo-mechanical deformation and reliability of adhesive flip chip assemblies during temperature cycling
    • W. S. Kwon et al., "The effect of Tg on thermo-mechanical deformation and reliability of adhesive flip chip assemblies during temperature cycling," in Proc Electron. Compon. Technol. Conf., 2004, pp. 1731-1737.
    • (2004) Proc Electron. Compon. Technol. Conf , pp. 1731-1737
    • Kwon, W.S.1
  • 13
    • 33847334704 scopus 로고    scopus 로고
    • Effects of the functional groups of nonconductive films (NCFs) on materials properties and reliability of NCF flip-chip-on-organic boards
    • C. K. Chung et al., "Effects of the functional groups of nonconductive films (NCFs) on materials properties and reliability of NCF flip-chip-on-organic boards," Proc Electron. Mater. Packag., pp. 156-161, 2005.
    • (2005) Proc Electron. Mater. Packag , pp. 156-161
    • Chung, C.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.