Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique

Applied Physics Letters

Volumn 89, Issue 6, 2006, Pages

  Shin, H J ^a   Jung, M C ^a   Chung, J ^b   Kim, K ^b   Lee, J C ^b   Lee, S P ^c  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CONTAMINATION; DEFORMATION; DEGRADATION; OPTICAL MICROSCOPY;

HOLE-TRANSPORT LAYERS; ORGANIC LAYERS; SCANNING PHOTOELECTRON MICROSCOPE (SPEM); STRUCTURAL DEFORMATION;

LIGHT EMITTING DIODES;

EID: 33747098540     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2335825     Document Type: Article

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