Slip-stick step-scanner for scanning probe microscopy

Review of Scientific Instruments

Volumn 76, Issue 6, 2005, Pages

  Meyer, Christine ^a   Sqalli, Omar ^a   Lorenz, Heribert ^a   Karrai, Khaled ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

LINEARITY; OPTICAL IMAGES; SCANNING PROBE MICROSCOPY; SLIP-STICK STEP-SCANNER;

CRYOGENICS; IMAGE ANALYSIS; LASER BEAM EFFECTS; LEAD COMPOUNDS; LIGHT REFLECTION; MICROSCOPIC EXAMINATION;

SCANNING;

EID: 20644453753     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1927105     Document Type: Article

References (9)

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8. C. Meyer, H. Lorenz, and K. Karrai, Appl. Phys. Lett. 83, 2420 (2003).
9. R. Curtis, C. Pearson, P. Gaard, and E. Ganz, Rev. Sci. Instrum. 64, 2687 (1993).