Simple retrofittable long-range x-y translation system for scanned probe microscopes

Review of Scientific Instruments

Volumn 67, Issue 10, 1996, Pages 3599-3604

  Smith, W F ^a   Abraham, M C ^a   Sloan, J M ^a   Switkes, M ^a,b  

^a HAVERFORD COLLEGE   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008436550     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147065     Document Type: Article

References (12)

1. See, for example, C. J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford University Press, New York, 1993), p. 242.
2. Y. Kuk and P. J. Silverman, Rev. Sci. Instrum. 60, 165 (1989).
3. See, for example, R. R. Schlittler and J. K. Gimzewski, J. Vac. Sci. Technol. B 14, 827 (1996), and references therein.
4. A. Asenjo, A. Buendia, J. M. Gomez-Rodriguez, and A. M. Baro, J. Vac. Sci. Technol. B 12, 1658 (1994).
5. C. Renner, P. Niedermann, A. D. Kent, and Ø. Fischer, Rev. Sci. Instrum. 61, 965 (1990).
6. M. Okano, K. Kajimura, S. Wakiyama, F. Sakai, W. Mizutani, and M. Ono, J. Vac. Sci. Technol. A 5, 3313 (1987).
7. Some less pronounced resonances were observed at lower frequencies. Observations with a high-resolution optical microscope indicated that these were resonances in the scanning tunneling microscope base. Since motion at these frequencies would cause about 1/4 the acceleration as motion at the piezo fundamental frequency, and also for simplicity, these modes were left out of the simulation.
8. C. J. Chen, Appl. Phys. Lett. 60, 132 (1992).
9. P. A. Tipler, Physics for Scientists and Engineers, 3rd ed. (Worth, New York, 1990), p. 110.
10. C. J. Chen, Ultramicroscopy 42-44, 1653 (1992).
11. M. E. Taylor, Rev. Sci. Instrum. 64, 154 (1993).
12. T. Tiedje and A. Brown, J. Appl. Phys. 68, 649 (1990).