Cryogenic scanning Hall-probe microscope with centimeter scan range and submicron resolution

Review of Scientific Instruments

Volumn 76, Issue 10, 2005, Pages 1-11

  Dinner, Rafael B ^a   Beasley, M R ^a   Moler, Kathryn A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC SCANNING HALL-PROBE MICROSCOPE; MAGNETIC IMAGING; MESOSCOPIC DEVICES; POWER LOSSES;

GRAIN BOUNDARIES; HALL EFFECT; HEAT LOSSES; IMAGING TECHNIQUES; MATHEMATICAL MODELS; SUPERCONDUCTING TAPES;

LOW TEMPERATURE PHENOMENA;

EID: 27544492794     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2072438     Document Type: Review

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24. The ADC card actually acquires the two wave forms by scanning its ADC between the two inputs, thus the samples are interleaved in time rather than simultaneous. The resultant 50 μs time shift is corrected before averaging the Hall or sample voltage wave forms.
25. Instead of finding zero crossings, one could fit a sinusoid to I(t) to determine its frequency and phase, which could be used to break B(t) into cycles. We found, however, that I(t) showed slight, but statistically significant, variations in frequency within each wave form causing the sinusoid to misrepresent some cycles.
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30. For example, Physik Instrumente (PI) GmbH & Co. KG, http://www.pi.ws, makes closed-loop, stick-slip piezo actuators.
31. See EXFO Burleigh Products Group Inc.'s Inchworm® motors, http://www.exfo.com, or Bookham Inc. New Focus division's Picomotors™, http://www.newfocus.com