Component analysis of a new Solid State x-ray image intensifier (SSXII) using photon transfer and instrumentation noise equivalent exposure (INEE) measurements

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 7258, Issue , 2009, Pages

  Gilcrist, Andrew Kuhls ^a   Bednarek, Daniel R ^a   Rudin, Stephen ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

Detectors; DQE; EMCCD; High resolution; INEE; MTF; Solid state x ray image intensifier; SSXII

Indexed keywords

DQE; EMCCD; HIGH-RESOLUTION; INEE; MTF; SSXII;

AMPLIFICATION; CHARGE COUPLED DEVICES; CHARGE TRAPPING; DETECTORS; IMAGE INTENSIFIERS (ELECTRON TUBE); IMAGE INTENSIFIERS (SOLID STATE); IMAGE SENSORS; IMAGING SYSTEMS; MEASUREMENTS; OPTICAL TRANSFER FUNCTION; OPTIMIZATION; PHOTONS; RADIATION DAMAGE; SIGNAL PROCESSING; X RAY ANALYSIS; X RAY APPARATUS; X RAYS;

MEDICAL IMAGING;

EID: 66749162169     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.813957     Document Type: Conference Paper

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