Photodiode forward bias to reduce temporal effects in a-Si based flat panel detectors

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 6913, Issue , 2008, Pages

  Mollov, Ivan ^a   Tognina, Carlo ^a   Colbeth, Richard ^a  

^a VARIAN MEDICAL SYSTEMS   (United States)

Author keywords

Amorphous silicon; Cone beam CT; Flat panel detector; Fluoroscopy; Ghosting; Lag; X ray imaging

Indexed keywords

FLAT PANEL DETECTORS; FLUOROSCOPY; GHOSTING; X RAY IMAGING;

AMORPHOUS SILICON; COMPUTERIZED TOMOGRAPHY; ELECTRONIC EQUIPMENT; FLAT PANEL DISPLAYS; IMAGING SYSTEMS; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS;

PHOTODIODES;

EID: 43449118093     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.769951     Document Type: Conference Paper

References (7)