MO‐E‐332‐07: Instrumentation Noise Equivalent Exposure (INEE) for Routine Quality Assurance: INEE Measurements On a Clinical Flat Panel Detector

Medical Physics

Volumn 35, Issue 6, 2008, Pages 2879-

  Szczykutowicz, T ^a   Kuhls gilcrist A ^a   Bednarek, D ^a   Rudin, S ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 66749187121     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2962406     Document Type: Conference Paper

References (0)