A practical exposure-equivalent metric for instrumentation noise in x-ray imaging systems

Physics in Medicine and Biology

Volumn 53, Issue 18, 2008, Pages 5107-5121

  Yadava, G K ^a   Kuhls Gilcrist, A T ^a   Rudin, S ^a,b,c   Patel, V K ^a   Hoffmann, K R ^a,b,c   Bednarek, D R ^a,b  

^a UNIVERSITY AT BUFFALO   (United States)

^b UNIVERSITY AT BUFFALO   (United States)

^c State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC INTENSITY; FOOD ADDITIVES; IMAGING SYSTEMS; IMAGING TECHNIQUES; INSTRUMENTS; OPTOELECTRONIC DEVICES; SIGNAL TO NOISE RATIO; X RAY ANALYSIS;

CLINICAL PRACTICES; DETECTOR PERFORMANCE; EXPERIMENTAL MEASUREMENTS; HIGH SENSITIVITIES; OPERATING RANGES; POST-PROCESSING; SIMULATION STUDIES; X-RAY DETECTORS; X-RAY IMAGERS; X-RAY IMAGING SYSTEMS;

DETECTORS;

ARTICLE; IMAGE PROCESSING; IMAGING SYSTEM; NOISE MEASUREMENT; NONHUMAN; PRIORITY JOURNAL; RADIATION DETECTOR; RADIATION EXPOSURE; SIGNAL NOISE RATIO; SIMULATION; VARIANCE; X RAY;

ALGORITHMS; ARTIFACTS; EQUIPMENT FAILURE ANALYSIS; RADIOGRAPHY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; UNITED STATES;

EID: 51849153206     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/53/18/017     Document Type: Article

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