The noise performance of electron multiplying charge-coupled devices

IEEE Transactions on Electron Devices

Volumn 50, Issue 5, 2003, Pages 1227-1232

  Robbins, Mark Stanford ^a   Hadwen, Benjamin James ^a  

^a E2V TECHNOLOGIES   (United Kingdom)

Author keywords

Charge coupled devices (CCD); Image intensifiers; Low light level imaging; Noise; Photon counting; Single photon detection

Indexed keywords

ELECTRONS; IMAGE INTENSIFIERS (ELECTRON TUBE); IMAGING SYSTEMS; MONTE CARLO METHODS; QUANTUM EFFICIENCY; SPURIOUS SIGNAL NOISE;

ELECTRON MULTIPLYING CHARGE COUPLED DEVICES; EXCESS NOISE FACTOR;

CHARGE COUPLED DEVICES;

EID: 0043175225     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.813462     Document Type: Article

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