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Volumn 311, Issue 13, 2009, Pages 3389-3394
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Formation of GaN nanodots on Si (1 1 1) by droplet nitridation
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Author keywords
A1. Atomic force microscopy; A1. Diffusion; A1. Nanostructures; A1. Nucleation; A3. Molecular beam epitaxy; B1. Nitrides
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Indexed keywords
A1. ATOMIC FORCE MICROSCOPY;
A1. DIFFUSION;
A1. NANOSTRUCTURES;
A1. NUCLEATION;
A3. MOLECULAR BEAM EPITAXY;
B1. NITRIDES;
ATOMIC FORCE MICROSCOPY;
ATOMS;
CRYSTAL GROWTH;
CRYSTALLITES;
DROP FORMATION;
EPITAXIAL GROWTH;
GALLIUM NITRIDE;
GROWTH TEMPERATURE;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
MOLECULAR DYNAMICS;
MOLECULAR SPECTROSCOPY;
NANOSTRUCTURES;
NITRIDATION;
NUCLEATION;
SEMICONDUCTING GALLIUM;
SEMICONDUCTOR QUANTUM WIRES;
SILICON;
X RAY PHOTOELECTRON SPECTROSCOPY;
GALLIUM ALLOYS;
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EID: 66649108774
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2009.04.025 Document Type: Article |
Times cited : (23)
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References (15)
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