Measurement of spontaneous polarization charge in C-face 3C-SiC/6H-SiC heterostructure with two-dimensional electron gas by capacitance-voltage method

Journal of Applied Physics

Volumn 105, Issue 10, 2009, Pages

  Lu, Jie ^a   Thomas, Chris I ^a   Chandrashekhar, M V S ^a   Spencer, Michael G ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE-VOLTAGE METHOD; CARRIER DENSITY; HETEROSTRUCTURE; POLARIZATION CHARGES; POLYTYPE HETEROSTRUCTURES; SEMICLASSICAL ANALYSIS; SPONTANEOUS POLARIZATIONS; TWO-DIMENSIONAL ELECTRON GAS (2DEG);

CAPACITANCE; ELECTRIC CONDUCTIVITY OF GASES; ELECTRON GAS; ELECTRONS; HETEROJUNCTIONS; POLARIZATION; SILICON CARBIDE; TWO DIMENSIONAL;

TWO DIMENSIONAL ELECTRON GAS;

EID: 66549114247     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3130398     Document Type: Article

References (13)

1. I. A. Khan and J. A. Cooper, IEEE Trans. Electron Devices 0018-9383 47, 269 (2000). 10.1109/16.822266
2. A. Fissel, Phys. Rep. 0370-1573 379, 149 (2003). 10.1016/S0370-1573(02) 00632-4
3. A. A. Lebedev, G. N. Mosina, I. P. Nikitina, N. S. Savkina, L. M. Sorokin, and A. S. Tregubova, Tech. Phys. Lett. 1063-7850 27, 1052 (2001). 10.1134/1.1432347
4. V. M. Polyakov and F. Schwierz, J. Appl. Phys. 0021-8979 98, 023709 (2005). 10.1063/1.1984070
5. M. V. S. Chandrashekhar, C. I. Thomas, J. Lu, and M. G. Spencer, Appl. Phys. Lett. 0003-6951 91, 033503 (2007). 10.1063/1.2754650
6. M. V. S. Chandrashekhar, C. I. Thomas, J. Lu, and M. G. Spencer, Appl. Phys. Lett. 0003-6951 90, 173509 (2007). 10.1063/1.2730738
7. A. Qteish, V. Heine, and R. J. Needs, Phys. Rev. B 0163-1829 45, 6534 (1992). 10.1103/PhysRevB.45.6534
8. Z. Yugang, S. Bo, Y. Huiqiang, L. Jie, Z. Huimei, Z. Rong, S. Yi, Z. Youdou, T. Someya, and Y. Arakawa, Chin. Phys. Lett. 0256-307X 19, 1172 (2002). 10.1088/0256-307X/19/8/343
9. H. Kroemer, Appl. Phys. Lett. 0003-6951 46, 504 (1985). 10.1063/1.95572
10. I. P. Smorchkova, C. R. Elsass, J. R. Ibbetson, R. Vetury, B. Heying, P. Fine, E. Haus, S. P. Denbarrs, J. S. Speck, and U. K. Mishra, J. Appl. Phys. 0021-8979 86, 4520 (1999). 10.1063/1.371396
11. O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman, R. Dimitrov, L. Wittmer, M. Stutzmann, W. Rieger, and J. Hilsenbeck, J. Appl. Phys. 0021-8979 85, 3222 (1999). 10.1063/1.369664
12. E. J. Miller, E. T. Yu, C. Poblenz, C. Elsass, and J. S. Speck, Appl. Phys. Lett. 0003-6951 80, 3551 (2002). 10.1063/1.1477275
13. S. Bai, R. P. Devaty, W. J. Choyke, U. Kaiser, and G. Wagner, Appl. Phys. Lett. 0003-6951 83, 3171 (2003). 10.1063/1.1618020