High-resolution three-dimensional reciprocal-space mapping of InAs nanowires

Journal of Applied Crystallography

Volumn 42, Issue 3, 2009, Pages 369-375

  Mariager, S O ^a   Lauridsen, S L ^a   Dohn, A ^a   Bovet, N ^b   Srensen, C B ^a   Schleputz C M ^c   Willmott, P R ^c   Feidenhansl, R ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Grazing incidence diffraction; Nanowires; Reciprocal space mapping

Indexed keywords

EID: 66249084888     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809009145     Document Type: Article

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