A ray tracing method to describe the angular profiles of diffraction rods in surface X ray experiments

Surface Review and Letters

Volumn 4, Issue 5, 1997, Pages 1035-1038

  Torrelles, X ^a   Alvarez, J ^a   Ferrer, S ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031321295     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97001243     Document Type: Article

References (6)

1. S. Ferrer and F. Comin, Proc. Synchrotron Radiation Instrumentation 94, Rev. Sec. Instrum. 66, 2082 (1995).
2. R. Feidenhansl, Surf. Sci. Rep. 10, 105 (1989).
3. W. H. Zachariasen, Theory of X Ray Diffraction in Crystals (Dover, New York, 1967).
4. P. Coppens, D. Cox, E. Vlieg and I. K. Robinson, Synchrotron Radiation Crystallography (T. J. Press (Padstow) Ltd., Padstow, Cornwall, Great Britain, 1992).
5. X. Torrelles, H. A. van der Vegt, V. H. Etgens, P. Fajardo, J. Alvarez and S. Ferrer, Surf. Sci. (1996), in press.
6. J. F. Vlieg, J. F. van der Veen, S. J. Gurman, C. Norris and J. E. MacDonald, Surf. Sci. 210, 301 (1989).