Corrections for surface X-ray diffraction measurements using the Z-axis geometry: Finite size effects in direct and reciprocal space

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1006-1018

  Robach, O ^a   Garreau, Y ^b   Aid K ^b   Veron Jolliot M B ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTALLOGRAPHY; EVOLUTION; GEOMETRY; POLARIZATION; QUANTITATIVE ASSAY; SIMULATION; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 0034481176     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800004696     Document Type: Article

References (12)

1. Feidenhans'l, R. (1989). Surf. Sci. Rep. 10, 105-188.
2. Lohmeier, M. & Vlieg, E. (1993). J. Appl. Cryst. 26, 706-716.
3. Robach, O. (1997). PhD thesis, Université Joseph Fourier, Grenoble I, France.
4. Robach, O., Renaud, G. & Barbier, A. (1998). Surf. Sci. 401, 227-235.
5. Schamper, C., Meyerheim, H. L. & Moritz, W. (1993). J. Appl. Cryst. 26, 687-696.
6. Specht, E. D. & Walker, F. L. (1993). J. Appl. Cryst. 26, 166-171.
7. Toney, M. F. & Wiesler, D. G. (1993). Acta Cryst. A49, 624-642.
8. Torrelles, X., Alvarez, J. & Ferrer, S. (1996). Surf. Rev. Lett. 4, 1035-1038.
9. Véron, M. B. (1996). PhD thesis, Université Pierre et Marie Curie, Paris VI, France.
10. Véron, M. B., Etgens, V. H., Sauvage-Simkin, M., Tatarenko, S., Daudin, B. & Brun-Le Cunff, D. (1996). J. Cryst. Growth, 159, 694-702.
11. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.
12. Vlieg, E., Van der Veen, J. F., Gurman, S. J., Norris, C. & Macdonald, J. E. (1989). Surf. Sci. 210, 301-321.