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Volumn 84, Issue 21, 2004, Pages 4239-4241

High-energy x-ray scattering in grazing incidence from nanometer-scale oxide wires

(7) Sakata, Osami a Takata, Masaki a Suematsu, Hiroyoshi a Matsuda, Akifumi b Akiba, Shusaku b Sasaki, Atsushi b Yoshimoto, Mamoru b

a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; CRYSTAL ORIENTATION; EXCIMER LASERS; HIGH ENERGY PHYSICS; IMAGE ANALYSIS; LASER BEAM EFFECTS; NANOSTRUCTURED MATERIALS; NICKEL COMPOUNDS; OPTOELECTRONIC DEVICES; SURFACE TREATMENT; THERMAL PLUMES; WIRE; X RAY DIFFRACTION; X RAY SCATTERING;

EXCIMER LASER BEAMS; FULL WIDTH AT HALF MAXIMUM (FWHM); NANOWIRES; SYNCHROTRON X-RAY SCATTERING;

CRYSTALLINE MATERIALS;

EID: 2942666194 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1756207 Document Type: Article

Times cited : (19)

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