A "nanoprism" probe for nano-optical applications

Advanced Materials

Volumn 21, Issue 12, 2009, Pages 1238-1242

  Kim, Taekyeong ^a   Kim, Deok Soo ^b   Lee, Byung Yang ^a   Kim, Zee Hwan ^b   Hong, Seunghun ^a  

^a Seoul National University   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; FIELD LOCALIZATION; GOLD NANOPARTICLES; HUMIDITY CONTROLLERS; LONG LINE; METALLIC NANOPARTICLES; NANO-OPTICAL APPLICATIONS; NANOPRISMS; SHARP EDGES; SI SURFACES; SILICON OXIDE SUBSTRATES; ZNO NANOROD;

ATOMIC FORCE MICROSCOPY; HUMIDITY CONTROL; NANOPARTICLES; NANORODS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SILICON COMPOUNDS; SILICON OXIDES; ZINC OXIDE;

PROBES;

EID: 66149124042     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200801528     Document Type: Article

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