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Volumn 7, Issue 3, 2008, Pages

Impact of finite laser bandwidth on the critical dimension of L/S structures

Author keywords

E95; E99; Laser bandwidth; Optical lithography; Optical proximity; Second moment

Indexed keywords

PHOTOLITHOGRAPHY; SCANNING;

EID: 65849409922     PISSN: 19325150     EISSN: 19325134     Source Type: Journal    
DOI: 10.1117/1.2964297     Document Type: Article
Times cited : (24)

References (13)
  • 1
    • 0033697537 scopus 로고    scopus 로고
    • Modeling the effects of excimer laser bandwidths on lithographic performance
    • A. Kroyan, J. Bendik, O. Semprez, N. Farrar, C. Rowan, and C. Mack, "Modeling the effects of excimer laser bandwidths on lithographic performance," Proc. SPIE 4000, 658-664 (2000).
    • (2000) Proc. SPIE , vol.4000 , pp. 658-664
    • Kroyan, A.1    Bendik, J.2    Semprez, O.3    Farrar, N.4    Rowan, C.5    MacK, C.6
  • 2
    • 0035758816 scopus 로고    scopus 로고
    • Effects of 95% intergral vs. FWHM bandwidth specifications on lithographic imaging
    • A. Kroyan, I. Lalovic, and N. Farrar, "Effects of 95% intergral vs. FWHM bandwidth specifications on lithographic imaging," Proc. SPIE 4346, 1244-1253 (2001).
    • (2001) Proc. SPIE , vol.4346 , pp. 1244-1253
    • Kroyan, A.1    Lalovic, I.2    Farrar, N.3
  • 3
    • 0035768142 scopus 로고    scopus 로고
    • Contribution of polychromatic illumination to optical proximity effects in the context of deep-UV lithography
    • A. Kroyan, I. Lalovic, and N. Farrar, "Contribution of polychromatic illumination to optical proximity effects in the context of deep-UV lithography," Proc. SPIE 4562, 1112 (2002).
    • (2002) Proc. SPIE , vol.4562 , pp. 1112
    • Kroyan, A.1    Lalovic, I.2    Farrar, N.3
  • 8
    • 42149137004 scopus 로고    scopus 로고
    • Fast and accurate laser bandwidth modeling of optical proximity effects
    • I. Lalovic, O. Kritsun, J. Bendik, M. Smith, C. Sallee, and N. Farrar, "Fast and accurate laser bandwidth modeling of optical proximity effects," Proc. SPIE 6730, 67301X-1-14 (2007).
    • (2007) Proc. SPIE , vol.6730
    • Lalovic, I.1    Kritsun, O.2    Bendik, J.3    Smith, M.4    Sallee, C.5    Farrar, N.6
  • 9
    • 84903081587 scopus 로고    scopus 로고
    • We try to avoid the more traditional but confusing term "aerialimages" intensity. What we mean with "resist-image" intensity is the image intensity in the resist, just below the resist surface
    • We try to avoid the more traditional but confusing term "aerialimages" intensity. What we mean with "resist-image" intensity is the image intensity in the resist, just below the resist surface.
  • 10
    • 84903053450 scopus 로고    scopus 로고
    • Commercial simulators, such as PROLITH™ (as of version 9.3.1), now allow the user to directly input the Fλ value and a corresponding laser spectrum file, generated from laser spectrometry data, which is accessible to the laser manufacturer
    • Commercial simulators, such as PROLITH™ (as of version 9.3.1), now allow the user to directly input the Fλ value and a corresponding laser spectrum file, generated from laser spectrometry data, which is accessible to the laser manufacturer.
  • 13
    • 84903038566 scopus 로고    scopus 로고
    • See, e.g., 〈http://en.wikipedia.org/wiki/Linear-regression〉


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.