-
1
-
-
0001522710
-
Investigations in optics, with special reference to the spectroscope
-
Rayleigh, L., "Investigations in optics, with special reference to the spectroscope," Philosophical Magazine 8, 261 (1879).
-
(1879)
Philosophical Magazine
, vol.8
, pp. 261
-
-
Rayleigh, L.1
-
2
-
-
62649142265
-
Characterization of binary and attenuated phase shift mask blanks for 32nm mask fabrication
-
Faure, T., Gallagher, E., Hibbs, M., Kindt, L., Racette, K., Wistrom, R., Zweber, A., Wagner, A., Kikuchi, Y., Komizo, T., and Nemoto, S., "Characterization of Binary and Attenuated Phase Shift Mask Blanks for 32nm Mask Fabrication," Proc. SPIE 7122, 712209 (2008).
-
(2008)
Proc. SPIE
, vol.7122
, pp. 712209
-
-
Faure, T.1
Gallagher, E.2
Hibbs, M.3
Kindt, L.4
Racette, K.5
Wistrom, R.6
Zweber, A.7
Wagner, A.8
Kikuchi, Y.9
Komizo, T.10
Nemoto, S.11
-
3
-
-
65849136857
-
Lithographic qualification of new absorbing MoSi binary mask blank for the 32-nm node and beyond
-
McIntyre, G. R., Tirapu-Azpiroz, J., Zhuang, L. L., Hibbs, M. S., Faure, T. B., Lai, K., and Kikuchi, Y., "Lithographic Qualification of New Absorbing MoSi Binary Mask Blank for the 32-nm Node and Beyond," Proceedings of SPIE, 7122 (2008).
-
(2008)
Proceedings of SPIE
, vol.7122
-
-
McIntyre, G.R.1
Tirapu-Azpiroz, J.2
Zhuang, L.L.3
Hibbs, M.S.4
Faure, T.B.5
Lai, K.6
Kikuchi, Y.7
-
4
-
-
25144436878
-
1 single damascene structures at NA=0.75, λ=193nm
-
1 Single Damascene Structures at NA=0.75, λ=193nm," Proceedings of SPIE, 5754, 1508-1518 (2005).
-
(2005)
Proceedings of SPIE
, vol.5754
, pp. 1508-1518
-
-
Maenhoudt, M.1
Versluijs, J.2
Struyf, H.3
Olmen, J.V.4
Hove, M.V.5
-
5
-
-
33748075152
-
Dark field Double Dipole Lithography (DDL) for 45nm node and beyond
-
Hsu, S., Burkhardt, M., Park, J., Broeke, D. V. D., and Chen, J. F., "Dark Field Double Dipole Lithography (DDL) for 45nm Node and Beyond," Proc. of SPIE 6283, 62830U (2006).
-
(2006)
Proc. of SPIE
, vol.6283
-
-
Hsu, S.1
Burkhardt, M.2
Park, J.3
Broeke, D.V.D.4
Chen, J.F.5
-
6
-
-
45449106995
-
Towards 3nm overlay and critical dimension uniformity: An integrated error budget for double patterning lithography
-
Arnold, W. H., "Towards 3nm Overlay and Critical Dimension Uniformity: an Integrated Error Budget for Double Patterning Lithography," Proc. of SPIE 6924, 692404 (2008).
-
(2008)
Proc. of SPIE
, vol.6924
, pp. 692404
-
-
Arnold, W.H.1
-
7
-
-
45449114981
-
Multi-patterning overlay control
-
Ausschnitt, P., "Multi-Patterning Overlay Control," Proc. of SPIE 6924, 692448 (2008).
-
(2008)
Proc. of SPIE
, vol.6924
, pp. 692448
-
-
Ausschnitt, P.1
-
8
-
-
80455128695
-
Low-variability negative and iterative spacer processes for sub-30-nm lines and holes
-
JanMar
-
Carlson, A. and. Liu, T.-J. K., "Low-Variability Negative and Iterative Spacer Processes for Sub-30-nm Lines and Holes," J. Micro/Nanolith. MEMS MOEMS 81, 011009 (JanMar 2009).
-
(2009)
J. Micro/Nanolith. MEMS MOEMS
, vol.81
, pp. 011009
-
-
Carlson, A.1
Liu, T.-J.K.2
-
9
-
-
0020587712
-
Contrast enhanced photolithography
-
Griffing, B. F. and West, P. R., "Contrast Enhanced Photolithography," IEEE Electron Device Letters EDL-4, No 1, 14-16 (1983).
-
(1983)
IEEE Electron Device Letters
, vol.EDL-4
, Issue.1
, pp. 14-16
-
-
Griffing, B.F.1
West, P.R.2
-
10
-
-
65849368366
-
Lithography system employing a solid immersion lens
-
Corle, T., Kino, G., and Mansfield, S., "Lithography system employing a solid immersion lens," United States Patent 5121256 (1992).
-
(1992)
United States Patent 5121256
-
-
Corle, T.1
Kino, G.2
Mansfield, S.3
-
11
-
-
25144433263
-
25nm immersion lithography at a 193nm wave-length
-
Smith, B. W., Fan, Y., Slocum, M., and Zavyalova, L., "25nm Immersion Lithography at a 193nm Wave-length," Proc. SPIE 5754, 141 (2004).
-
(2004)
Proc. SPIE
, vol.5754
, pp. 141
-
-
Smith, B.W.1
Fan, Y.2
Slocum, M.3
Zavyalova, L.4
-
13
-
-
65849169654
-
High resolution imaging process using an in-situ image modifying layer
-
Patel, K., Huang, W.-S., Lawson, M. C., and Tirapu-Azpiroz, J., "High Resolution Imaging Process Using an In-Situ Image Modifying Layer," Patent Pending US20080145793A1 (2006).
-
(2006)
Patent Pending US20080145793A1
-
-
Patel, K.1
Huang, W.-S.2
Lawson, M.C.3
Tirapu-Azpiroz, J.4
-
14
-
-
17444418334
-
Super-resolution imaging through a planar silver layer
-
Melville, D. O. S. and Blaikie, R. J., "Super-Resolution Imaging Through a Planar Silver Layer," Optics Express, 13(6), 2127-2134 (2005).
-
(2005)
Optics Express
, vol.13
, Issue.6
, pp. 2127-2134
-
-
Melville, D.O.S.1
Blaikie, R.J.2
-
15
-
-
55049120001
-
Reconstruction of periodic structures from optical scattering measurements using adjoint equations
-
August
-
Feijóo, G. R., "Reconstruction of periodic structures from optical scattering measurements using adjoint equations," J. Opt. Soc. Am. A 25, 1906-1920 (August 2008).
-
(2008)
J. Opt. Soc. Am. A
, vol.25
, pp. 1906-1920
-
-
Feijóo, G.R.1
-
16
-
-
53249109880
-
Sensitivities of TE-polarized electromagnetic fields to shape changes in diffraction gratings
-
November
-
Feijóo, G. R., "Sensitivities of TE-polarized electromagnetic fields to shape changes in diffraction gratings," Eng. Ana. Bound. 32, 948-956 (November 2008).
-
(2008)
Eng. Ana. Bound.
, vol.32
, pp. 948-956
-
-
Feijóo, G.R.1
-
17
-
-
71549126234
-
Optimum mask and source patterns to print a given shape
-
Rosenbluth, A. E., Bukofsky, S., Fonseca, C., Hibbs, M., Lai, K., Molless, A., Singh, R., and Wong, A., "Optimum Mask and Source Patterns to Print a Given Shape," J. Microlithogr. Microfabrication, Microsyst. 1(1), 13-30 (2002).
-
(2002)
J. Microlithogr. Microfabrication, Microsyst.
, vol.1
, Issue.1
, pp. 13-30
-
-
Rosenbluth, A.E.1
Bukofsky, S.2
Fonseca, C.3
Hibbs, M.4
Lai, K.5
Molless, A.6
Singh, R.7
Wong, A.8
-
18
-
-
65849129717
-
Tradeoffs in the intensive optimization of masks and sources for 22nm lithography
-
Rosenbluth, A. E., Melville, D. O., Tian, K., Bagheri, S., Azpiroz, J. T., Lai, K., Waechter, A., Inoue, T., Ladanyi, L., Barahona, F., Scheinberg, K., Sakamoto, M., Muta, H., and Hibbs, M., "Tradeoffs in the Intensive Optimization of Masks and Sources for 22nm Lithography," Proc. SPIE 7274-7307 (2009).
-
(2009)
Proc. SPIE
, pp. 7274-7307
-
-
Rosenbluth, A.E.1
Melville, D.O.2
Tian, K.3
Bagheri, S.4
Azpiroz, J.T.5
Lai, K.6
Waechter, A.7
Inoue, T.8
Ladanyi, L.9
Barahona, F.10
Scheinberg, K.11
Sakamoto, M.12
Muta, H.13
Hibbs, M.14
-
22
-
-
0029307028
-
Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings
-
Moharam, M. G., Grann, E. B., Pommet, D. A., and Gaylord, T. K., "Formulation for Stable and Efficient Implementation of the Rigorous Coupled-Wave Analysis of Binary Gratings," Journal of the Optical Society of America A 12(15), 10681076 (1995).
-
(1995)
Journal of the Optical Society of America A
, vol.12
, Issue.15
, pp. 10681076
-
-
Moharam, M.G.1
Grann, E.B.2
Pommet, D.A.3
Gaylord, T.K.4
-
23
-
-
0029306568
-
Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings: Enhanced transmittance matrix approach
-
Moharam, M. G., Pommet, D. A., Grann, E. B., and Gaylord, T. K., "Stable Implementation of the Rigorous Coupled-Wave Analysis for Surface-Relief Gratings: Enhanced Transmittance Matrix Approach," Journal of the Optical Society of America A 12(15), 10771086 (1995).
-
(1995)
Journal of the Optical Society of America A
, vol.12
, Issue.15
, pp. 10771086
-
-
Moharam, M.G.1
Pommet, D.A.2
Grann, E.B.3
Gaylord, T.K.4
-
24
-
-
0036414483
-
3D lumped parameter model for lithographic simulations
-
Byers, J., Smith, M., and Mack, C., "3D Lumped Parameter Model for Lithographic Simulations," Proc. SPIE 4691, 125 (2002).
-
(2002)
Proc. SPIE
, vol.4691
, pp. 125
-
-
Byers, J.1
Smith, M.2
Mack, C.3
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