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Volumn 7274, Issue , 2009, Pages

A computational technique to optimally design in-situ diffractive elements: Applications to projection lithography at the resist resolution limit

Author keywords

Adjoint equations; Computational lithography; Double patterning; Holographic interferometry; Inverse lithography; Near field; Optimization; Talbot self imaging

Indexed keywords

ADJOINT EQUATIONS; COMPUTATIONAL LITHOGRAPHY; DOUBLE PATTERNING; INVERSE LITHOGRAPHY; NEAR-FIELD; TALBOT SELF-IMAGING;

EID: 65849124054     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.814251     Document Type: Conference Paper
Times cited : (1)

References (24)
  • 1
    • 0001522710 scopus 로고
    • Investigations in optics, with special reference to the spectroscope
    • Rayleigh, L., "Investigations in optics, with special reference to the spectroscope," Philosophical Magazine 8, 261 (1879).
    • (1879) Philosophical Magazine , vol.8 , pp. 261
    • Rayleigh, L.1
  • 5
    • 33748075152 scopus 로고    scopus 로고
    • Dark field Double Dipole Lithography (DDL) for 45nm node and beyond
    • Hsu, S., Burkhardt, M., Park, J., Broeke, D. V. D., and Chen, J. F., "Dark Field Double Dipole Lithography (DDL) for 45nm Node and Beyond," Proc. of SPIE 6283, 62830U (2006).
    • (2006) Proc. of SPIE , vol.6283
    • Hsu, S.1    Burkhardt, M.2    Park, J.3    Broeke, D.V.D.4    Chen, J.F.5
  • 6
    • 45449106995 scopus 로고    scopus 로고
    • Towards 3nm overlay and critical dimension uniformity: An integrated error budget for double patterning lithography
    • Arnold, W. H., "Towards 3nm Overlay and Critical Dimension Uniformity: an Integrated Error Budget for Double Patterning Lithography," Proc. of SPIE 6924, 692404 (2008).
    • (2008) Proc. of SPIE , vol.6924 , pp. 692404
    • Arnold, W.H.1
  • 7
    • 45449114981 scopus 로고    scopus 로고
    • Multi-patterning overlay control
    • Ausschnitt, P., "Multi-Patterning Overlay Control," Proc. of SPIE 6924, 692448 (2008).
    • (2008) Proc. of SPIE , vol.6924 , pp. 692448
    • Ausschnitt, P.1
  • 8
    • 80455128695 scopus 로고    scopus 로고
    • Low-variability negative and iterative spacer processes for sub-30-nm lines and holes
    • JanMar
    • Carlson, A. and. Liu, T.-J. K., "Low-Variability Negative and Iterative Spacer Processes for Sub-30-nm Lines and Holes," J. Micro/Nanolith. MEMS MOEMS 81, 011009 (JanMar 2009).
    • (2009) J. Micro/Nanolith. MEMS MOEMS , vol.81 , pp. 011009
    • Carlson, A.1    Liu, T.-J.K.2
  • 9
    • 0020587712 scopus 로고
    • Contrast enhanced photolithography
    • Griffing, B. F. and West, P. R., "Contrast Enhanced Photolithography," IEEE Electron Device Letters EDL-4, No 1, 14-16 (1983).
    • (1983) IEEE Electron Device Letters , vol.EDL-4 , Issue.1 , pp. 14-16
    • Griffing, B.F.1    West, P.R.2
  • 11
    • 25144433263 scopus 로고    scopus 로고
    • 25nm immersion lithography at a 193nm wave-length
    • Smith, B. W., Fan, Y., Slocum, M., and Zavyalova, L., "25nm Immersion Lithography at a 193nm Wave-length," Proc. SPIE 5754, 141 (2004).
    • (2004) Proc. SPIE , vol.5754 , pp. 141
    • Smith, B.W.1    Fan, Y.2    Slocum, M.3    Zavyalova, L.4
  • 14
    • 17444418334 scopus 로고    scopus 로고
    • Super-resolution imaging through a planar silver layer
    • Melville, D. O. S. and Blaikie, R. J., "Super-Resolution Imaging Through a Planar Silver Layer," Optics Express, 13(6), 2127-2134 (2005).
    • (2005) Optics Express , vol.13 , Issue.6 , pp. 2127-2134
    • Melville, D.O.S.1    Blaikie, R.J.2
  • 15
    • 55049120001 scopus 로고    scopus 로고
    • Reconstruction of periodic structures from optical scattering measurements using adjoint equations
    • August
    • Feijóo, G. R., "Reconstruction of periodic structures from optical scattering measurements using adjoint equations," J. Opt. Soc. Am. A 25, 1906-1920 (August 2008).
    • (2008) J. Opt. Soc. Am. A , vol.25 , pp. 1906-1920
    • Feijóo, G.R.1
  • 16
    • 53249109880 scopus 로고    scopus 로고
    • Sensitivities of TE-polarized electromagnetic fields to shape changes in diffraction gratings
    • November
    • Feijóo, G. R., "Sensitivities of TE-polarized electromagnetic fields to shape changes in diffraction gratings," Eng. Ana. Bound. 32, 948-956 (November 2008).
    • (2008) Eng. Ana. Bound. , vol.32 , pp. 948-956
    • Feijóo, G.R.1
  • 22
    • 0029307028 scopus 로고
    • Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings
    • Moharam, M. G., Grann, E. B., Pommet, D. A., and Gaylord, T. K., "Formulation for Stable and Efficient Implementation of the Rigorous Coupled-Wave Analysis of Binary Gratings," Journal of the Optical Society of America A 12(15), 10681076 (1995).
    • (1995) Journal of the Optical Society of America A , vol.12 , Issue.15 , pp. 10681076
    • Moharam, M.G.1    Grann, E.B.2    Pommet, D.A.3    Gaylord, T.K.4
  • 23
    • 0029306568 scopus 로고
    • Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings: Enhanced transmittance matrix approach
    • Moharam, M. G., Pommet, D. A., Grann, E. B., and Gaylord, T. K., "Stable Implementation of the Rigorous Coupled-Wave Analysis for Surface-Relief Gratings: Enhanced Transmittance Matrix Approach," Journal of the Optical Society of America A 12(15), 10771086 (1995).
    • (1995) Journal of the Optical Society of America A , vol.12 , Issue.15 , pp. 10771086
    • Moharam, M.G.1    Pommet, D.A.2    Grann, E.B.3    Gaylord, T.K.4
  • 24
    • 0036414483 scopus 로고    scopus 로고
    • 3D lumped parameter model for lithographic simulations
    • Byers, J., Smith, M., and Mack, C., "3D Lumped Parameter Model for Lithographic Simulations," Proc. SPIE 4691, 125 (2002).
    • (2002) Proc. SPIE , vol.4691 , pp. 125
    • Byers, J.1    Smith, M.2    Mack, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.