Nanofretting behaviors of monocrystalline silicon (1 0 0) against diamond tips in atmosphere and vacuum

Wear

Volumn 267, Issue 1-4, 2009, Pages 322-329

  Yu, J X ^a   Qian, L M ^a   Yu, B J ^a   Zhou, Z R ^a  

^a SOUTHWEST JIAOTONG UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Hillock; Monocrystalline silicon; Nanofretting; Nanotribology

Indexed keywords

CONTACT PRESSURES; DAMAGE MODES; DIAMOND TIP; HIGH LOAD; HILLOCK; IN-VACUUM; LOW LOAD; MONOCRYSTALLINE SILICON; NANOFRETTING; NORMAL LOADS; OXIDE LAYER; SI(1 0 0); SOFT COATING; SPHERICAL DIAMOND; TANGENTIAL FORCE; VACUUM CONDITION;

ATOMIC FORCE MICROSCOPY; ATOMS; DIAMONDS; NANOTRIBOLOGY; OXYGEN;

VACUUM;

EID: 65749102863     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2008.11.008     Document Type: Article

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