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Volumn 27, Issue 5, 2007, Pages 472-476

An improved calibration method for friction force in atomic force microscopy

Author keywords

Atomic force microscopy; Friction force calibration; Nanotribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; LOADS (FORCES); NANOTRIBOLOGY;

EID: 35949002047     PISSN: 10040595     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (10)
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  • 4
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    • Chemical force microscopy-exploiting chemically-modified tips to quantify adhesion, friction, and functional-group distributions in molecular assemblies
    • Noy A, Frisbie C D, Rozsnyai L F, et al. Chemical force microscopy-exploiting chemically-modified tips to quantify adhesion, friction, and functional-group distributions in molecular assemblies [J]. J Am Chem Soc, 1995, 117 (7): 943-951.
    • (1995) J Am Chem Soc , vol.117 , Issue.7 , pp. 943-951
    • Noy, A.1    Frisbie, C.D.2    Rozsnyai, L.F.3
  • 5
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    • Quantitative analysis of lateral force microscopy experiments
    • Schwarz U D, Koster P, Wiesendanger R. Quantitative analysis of lateral force microscopy experiments [J]. Rev Sci Instrum, 1996, 67: 2560.
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    • Schwarz, U.D.1    Koster, P.2    Wiesendanger, R.3
  • 6
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    • Calibration of frictional forces in atomic force microscopy
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    • Ogletree, D.F.1    Carpick, R.W.2    Salmeron, M.3
  • 7
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    • An improved wedge calibration method for lateral force in atomic force microscopy
    • Varenberg M, Etsion I, Halperin G. An improved wedge calibration method for lateral force in atomic force microscopy [J]. Rev Sci Instrum, 2003, 74: 3362-3367.
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    • Varenberg, M.1    Etsion, I.2    Halperin, G.3
  • 8
    • 0001026801 scopus 로고    scopus 로고
    • A method for determining the spring constant of cantilevers for atomic force microscopy
    • Torii A, Sasaki M, Hane K, et al. A method for determining the spring constant of cantilevers for atomic force microscopy [J]. Meas Sci Technol, 1996, 7: 179-184.
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  • 9
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    • Tip in-situ chemical modification and its effects on tribological measurements
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  • 10
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    • Study on micro friction and adhesion force of OTS self-assembled film (II)
    • Qian L M, Luo J B, Wen S Z, et al. Study on micro friction and adhesion force of OTS self-assembled film (II) [J]. Acta Phys Sin, 2000, 49: 2247-2253.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.