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Volumn 311, Issue 10, 2009, Pages 2831-2833
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Low-pressure HVPE growth of crack-free thick AlN on a trench-patterned AlN template
a
MIE UNIVERSITY
(Japan)
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Author keywords
A1. Crack free; A3. LP HVPE; B1. AlN
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Indexed keywords
A1. CRACK-FREE;
A3. LP-HVPE;
ALN;
ALN LAYERS;
ALN-LAYER GROWN;
ATOMIC STEP;
B1. ALN;
CRACK FREE;
HYDRIDE VAPOR PHASE EPITAXY;
PRESSSURE;
ROOT MEAN SQUARE ROUGHNESS;
SMOOTH SURFACE;
X RAY ROCKING CURVE;
ATOMIC FORCE MICROSCOPY;
ATOMS;
CRYSTAL GROWTH;
CRACKS;
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EID: 65749097863
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2009.01.022 Document Type: Article |
Times cited : (52)
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References (12)
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