Quantifying the size-dependent effect of the residual surface stress on the resonant frequencies of silicon nanowires if finite deformation kinematics are considered

Nanotechnology

Volumn 20, Issue 11, 2009, Pages

  Park, Harold S ^a  

^a UCB 450   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORN MODELS; EIGENVALUE PROBLEMS; ELASTIC THEORIES; FINITE DEFORMATIONS; NANO-SCALE SURFACES; RELATIVE CONTRIBUTIONS; RESONANT FREQUENCIES; SILICON NANOWIRES; SIZE DEPENDENCES; SIZE-DEPENDENT EFFECTS; STANDARD FINITE ELEMENTS; STRAIN DEPENDENTS; SURFACE STRESS;

CONTINUUM MECHANICS; DEFORMATION; EIGENVALUES AND EIGENFUNCTIONS; ELASTICITY; ELECTRIC WIRE; EVAPORATIVE COOLING SYSTEMS; FORECASTING; KINEMATICS; NANOWIRES; STRAIN MEASUREMENT; STRESSES; SURFACE PROPERTIES;

NATURAL FREQUENCIES;

NANOWIRE; SILICON;

ARTICLE; ELASTICITY; KINEMATICS; MATHEMATICAL MODEL; NANOANALYSIS; NONLINEAR SYSTEM; PARTICLE SIZE; PRIORITY JOURNAL; SURFACE STRESS;

EID: 65549098190     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/11/115701     Document Type: Article

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