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Review of Scientific Instruments

Volumn 80, Issue 4, 2009, Pages

Tapping mode microwave impedance microscopy

(6) Lai, K a Kundhikanjana, W a Peng, H b Cui, Y b Kelly, M A a Shen, Z X a

a STANFORD UNIVERSITY (United States)

b Stanford University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE MEASUREMENTS; ATOMIC FORCE MICROSCOPES; CANTILEVER PROBES; CONTACT MODES; EXPERIMENTAL DATUM; FINITE-ELEMENT ANALYSIS; MICROWAVE IMAGING; MICROWAVE IMPEDANCES; NANO-DEVICES; TAPPING MODES; THERMAL DRIFTS; THIN-FILM DIELECTRICS; TIME-SCALE; TIP APICES; TIP-SAMPLE INTERACTIONS;

DIELECTRIC PROPERTIES;

MICROWAVES;

EID: 65449141344 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3123406 Document Type: Article

Times cited : (50)

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