Structural and dielectric study of parylene C thin films

Applied Physics Letters

Volumn 94, Issue 15, 2009, Pages

  Kahouli, A ^a,b   Sylvestre, A ^a   Ortega, L ^c   Jomni, F ^b   Yangui, B ^b   Maillard, M ^d   Berge, B ^d   Robert, J C ^d   Legrand, J ^d  

^a LABORATOIRE D ELECTROTECHNIQUE DE GRENOBLE   (France)

^b Organization and Properties LabMOP   (Tunisia)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d Varioptic   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARRHENIUS LAWS; CRYOGENIC TEMPERATURES; CRYSTALLINITY; DIELECTRIC CONSTANTS; DIELECTRIC STUDIES; LOCAL MOTIONS; PARYLENE; PARYLENE-C; PHENYL GROUPS; RELAXATION MECHANISMS; SEGMENTAL MOTIONS; SEMI-CRYSTALLINE; VOGEL-FULCHER;

ACTIVATION ENERGY;

EID: 65249183092     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3114404     Document Type: Article

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