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Volumn 92, Issue 15, 2008, Pages

Impact of semiconductor/contact metal thickness ratio on organic thin-film transistor performance

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; ELECTRON MOBILITY; MICROSTRUCTURE; PHOTOLITHOGRAPHY; THICKNESS MEASUREMENT;

FILM MORPHOLOGY; ORGANIC THIN-FILM TRANSISTORS; PENTACENE; THICKNESS RATIO;

THIN FILM TRANSISTORS;

EID: 42349101426 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2904968 Document Type: Article

Times cited : (15)

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