Determination of cross-link density in ion-irradiated polystyrene surfaces from rippling

Langmuir

Volumn 25, Issue 5, 2009, Pages 3108-3114

  Karade, Yogesh ^a   Pihan, Sascha A ^b   Brünger, Wilhelm H ^c   Dietzel, Andreas ^a   Berger, Rüdiger ^b   Graf, Karlheinz ^b,d  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^c FRAUNHOFER INSTITUTE FOR SILICON TECHNOLOGY ISIT   (Germany)

^d UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCATTERINGS; CROSS-LINK DENSITIES; DISPLACEMENT PROCESS; ELASTIC MODELS; HYDROGEN VACANCIES; ION FLUENCE; IRRADIATED AREAS; LAYERED POLYMERS; NETWORK DENSITIES; PHYSICAL MODIFICATIONS; POLYMER CHAINS; POLYMER SURFACES; SURFACE LAYERS; SURFACE RIPPLING; YOUNG'S MODULUS;

CROSSLINKING; ELASTIC MODULI; GLASS; GLASS TRANSITION; HYDROGEN; IONS; MECHANICAL PROPERTIES; POLYMERS; POLYSTYRENES; SURFACE CHEMISTRY;

CHEMICAL MODIFICATION;

BIOMATERIAL; CROSS LINKING REAGENT; ELASTOMER; MICROSPHERE; NANOMATERIAL; OXYGEN; POLYMER; POLYSTYRENE DERIVATIVE;

ADSORPTION; ARTICLE; CHEMISTRY; ELASTICITY; FINITE ELEMENT ANALYSIS; MATERIALS TESTING; METHODOLOGY; SURFACE PROPERTY; TENSILE STRENGTH;

ADSORPTION; BIOCOMPATIBLE MATERIALS; CHEMISTRY; CROSS-LINKING REAGENTS; ELASTICITY; ELASTOMERS; FINITE ELEMENT ANALYSIS; MATERIALS TESTING; MICROSPHERES; NANOSTRUCTURES; OXYGEN; POLYMERS; POLYSTYRENES; SURFACE PROPERTIES; TENSILE STRENGTH;

EID: 65249084931     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la802363v     Document Type: Article

References (56)

1. Detrait, E.; Lhoest, J.-B.; Knoops, B.; Bertrand, P.; van den Bosch de Aguilar, Ph. J. Neurosci. Methods 1998, 84, 193-204.
2. Hendrick, V.; Muniz, E.; Geuskens, G.; Werenne, J. Cyptechnology 2001, 36, 49-53.
3. Cao, T. B.; Xu, Q. B.; Winkleman, A.; Whitesides, G. M. Small 2005, 1, 1191-1195.
4. Senkan, S. M. Nature 1988 394 350-353.
5. Takano, N.; Doeswijk, L. M.; van den Boogaart, M. A. F.; Auerswald, J.; Knapp, H. F.; Dubochet. O.; Hessler. T.; Brugger, J. J. Micromech. Microeng. 2006, 16, 1606-1613.
6. Barton. J. E.; Odom, T. W. Nano Lett. 2004, 4, 1525-1528.
7. Bowden, N.; Huck, W. T. S.; Paul, K. E.; Whitesides, G. M. Appl. Phys. Lett. 1999, 75, 2557-2559.
8. Stafford, C. M.; Harrison, C.; Beers, K. L.; Karim, A.; Amis, E. J.; Vanlandingham, M. R.; Kim, H.-C.; Volksen, W.; Miller, R. D.; Simonyi. E. E. Nat. Mater. 2004, 5, 545-550.
9. Volynskii, A. L.; Bazhenov, S.; Lebedeva, O. V.; Bakeev, N. F. J. Mater. Sci. 2000, 35, 547-554.
10. Knittel, D.; Resting, W.; Schollmeyer, E. Polym. Int. 1997,43, 231-239.
11. Genzer, J.; Groenewold, J. Soft Matter 2006, 2, 310-323.
12. Brush, D.O.; Almorth, B.O. Buckling of Bars, Plates and Shells; McGraw-Hill: New York, 1975.
13. Bowden, N.; Brittain, S.; Evans, A. G.; Hutchinson, J. W.; Whitesides, G. M. Nature 1998, 393, 146-149.
14. Katzenberg, F. Macromol. Mater. Eng. 2001, 286, 26-29.
15. Katzenberg, F. Nanotechnology 2003, 14, 1019-1022.
16. Harrison, C.; Stafford, C. M.; Zhang. W. H.; Karim, A. Appl. Phys. Lett. 2004, 85, 4016-4018.
17. Lu, C. H.; Dönch, I.; Nolle, M.; Fery. A. Chem. Mater. 2006, 18, 6204-6210.
18. Lu, C. H.; Mohwald, H.; Fery, A. Soft. Matter 2007, 3, 1530-1536.
19. Nolte, A. J.; Rubner, M. F.; Cohen, R. E. Macromolecules 2005, 38, 5367-5370.
20. Carbone, G.; Mangialardi, L. J. Mech. Phys. Solids 2004, 52, 1267-1287.
21. Chennamsetty, R.; Escobar. I.; Xu, X. L. Desalination 2006, 188, 203-212.
22. Herden, V.; Klaumünzer. S.; Sehnabel, W. Nucl. lustrum. Methods Phys. Res. B 1998, 146, 491-495.
23. Büscher. K.; Berger, R.; Brünger, W.; Graf, K. Microelectron. Eng. 2006, 83, 819-822.
24. Martinez-Pardo, M. E.; Cardoso, J.; Vazquez, H.; Aguilar, M.; Rickards, J.; Andrade, E. Nucl. lustrum. Methods Phys. Res. B 1997, 131, 219-225.
25. Brünger, W. H.; Torkler, M.; Leung, K. N.; Lee, Y.; Williams, M. D.; Loeschner. H.; Stengl. G.; Fallmann, W.; Paschke. F.; Stangl, G.; Rangelow, I. W.; Hudek, P. Microelectron. Eng. 1999, 46, 477-480.
26. Dietzel, A.; Berger, R.; Grimm, H.; Bruenger, W. H.; Dzionk, C.; Letzkus, F.; Springer. R.; Loeschner, H.; Platzgummer, E.; Stengl, G.; Bandic. Z. Z.; Terris, B. D. IEEE Trans. Magn. 2002, 38, 1952-1954.
27. Loeschner, H.; Stengl, G.; Buschbeck, H.; Chalupka, A.; Lammer, G.; Platzgummer, E.; Vonach, H.; de Jager, P. W. H.; Kaesmaier, R.; Ehrmann, A.; Hirscher, S.; Wolter, A.; Dietzel, A.; Berger, R.; Grimm, H.; Terris, B. D.; Bruenger, W. H.; Gross, G.; Fortagne, O.; Adam, D.; Bohm, M.; Eichhorn, H.; Springer, R.; Butschke, J.; Letzkus, F.; Ruchhoeft, P.; Wolfe, J. C. J. Microlithogr. Microfabr. Mcrosyst. 2003, 2, 34-48.
28. Ziegler, J. F.; Biersack, J. P. SRIM cf. http://www.srim.org. 2006.
29. Kuhn, W. .J. Polym. Sci. 1946, I, 380-388.
30. Zhang, X. M.; Ajji. A. J. Appl. Polym. Sci. 2003, 89, 487-496.
31. Brandrup, J.; Immergut, E. H.; Grulke, E. A.; Abe, A.; Bloch, D. R. Polymer Handbook, 4th ed.; John Wiley & Sons: New York, 1999.
32. Cleaver, J. A. S.; Looi, L. Powder Tectmol. 2007, 174, 34-37.
33. Seitz, J. T. J. Appl. Polym. Sci. 1993, 49, 1331-1351.
34. Adamson. A. W. Physical Chemistry of Surfaces, 5th ed.: John Wilev & Sons: New York, 1990; p 79.
35. Bonaccurso, E.; Cappella, B.; Graf. K. J. Phys. Chem. B 2006, 110, 17918-17924.
36. Kogler. F. R.; Koch. T.; Peterlik. H.; Seidler. S.; Schubert, U. J. Polym. Sci., Part B: Polym. Phys. 2007, 45, 2215-2231.
37. Treloar, L. R. G. The Physics of Rubber Elasticity, 3rd ed.; Clarendon Press: Oxford, U.K., 1975.
38. van Melick, H. G. H.; Govaert, L. E.; Meijer, H. E. H. Polymer 2003, 44, 2493-2502.
39. Zoller. P.; Hoehn, H. H. .J. Polym. Sci., Part B: Polym. Phys. 1982, 20, 1385-1397.
40. Binder, G.; Muller, F. H. Kolloid Z. Z. Polym. 1961, 178, 129-149.
41. Amekura, H.; Plaksin, O. A.; Umeda, N.; Kono, K.; Kishimoto, N.; Buchal, Ch. Vacuum 2006, 80, 802-805.
42. Kim, H. B.; Hobler, G.; Steiger, A.; Luestein, A.; Bertagnolli, E. Nanotechnology 2007, 18, 245303-245311.
43. Zhu, Z. Y.; Jin, Y. F.; Liu, C. L.; Sun, Y. M.; Hou, M. D.; Zhang, C. H.; Wang, Z. G.; Liu, J.; Chen, X. X,; Li, B. Q.; Wang, Y. B. Nucl. Instrum. Methods Phys. Res. B 2000, 169, 83-88.
44. Bonaccurso, E.; Graf, K. Langmuir 2004, 20, 11183-11190.
45. Grant, J. L.; Dunn. D. S.; McClure,D. J. J. Vacuum.Sci. Technol. A 1988, 6, 2213-2220.
46. White, L. R. J. Collorid Interface Sci. 2003, 258, 82-96.
47. Xu, X. D.; Kwok. R. W. M.; Lau. W. M. Thin Solid Films 2006, 514, 182-187.
48. Zheng, Z.; Xu, X. D.; Fan, X. L.; Lau, W. M.; Kwok. R. W. M. J. Am. Chem. Soc. 2004, 126, 12336-12342.
49. Karade. Y.; Graf, K.; Brunger, W. H.; Dietzel, A.; Berger,R. Microelectron. Eng. 2007, 84, 797-801.
50. Donald. A. M.; Kramer. E. J. J. Polym. Sci., Part B: Polym. Phys. 1982, 20, 899-909.
51. Ferry, J. D. Viscoelastic Properties of Polymers, 3rd ed.; John Wiley & Sons: New York. 1980; p 420.
52. Smith, T. L. J. Polvm. Sci., Part C: Polym. Symp. 1974, 46, 97-114.
53. Bonaccurso, E.; Butt, H.-J.; Graf, K. European Polymer Journal 2004, 40, 975-980.
54. Bonaccurso, E.; Cappella, B.; Graf. K. J. Phys. Chem. B 2006, 110, 17918-17924.
55. Zhang, R.; Graf. K.; Berger, R. Appl. Phys. Lett. 2006, 89, 223114.
56. Zhang, R.; Cherdhirankorn, T.; Graf, K.; Kovnov, K.; Berger, R. Microelectron. Eng. 2008, 85, 1261-1264.