Medium-term thermal stability of amorphous Ge2Sb2Te5 flash-evaporated thin films with regards to change in structure and optical properties

Thin Solid Films

Volumn 517, Issue 16, 2009, Pages 4694-4697

  Wagner, T ^a   Orava, J ^a   Prikryl, J ^a   Kohoutek, T ^a   Bartos, M ^a   Frumar, M ^a  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Chalcogenides; Crystallization; Ellipsometry; Evaporation; Nanostructures; Transmission electron microscopy; X ray diffraction

Indexed keywords

AMORPHOUS PHASE; COOLING CYCLES; NANO-CRYSTALLINE; NANO-CRYSTALS; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL BAND GAP ENERGIES; RESISTIVITY FLUCTUATIONS; SPUTTERED FILMS; TEMPERATURE CYCLING; TEMPERATURE TREATMENTS; THERMAL STABILITIES;

CHALCOGENIDES; CRYSTALLIZATION; DIFFRACTION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTRON MICROSCOPES; ELLIPSOMETRY; EVAPORATION; GERMANIUM; NANOSTRUCTURES; REFRACTIVE INDEX; TELLURIUM COMPOUNDS; THERMODYNAMIC STABILITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPORS; X RAY DIFFRACTION;

AMORPHOUS FILMS;

EID: 65149103593     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.074     Document Type: Article

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