Low temperature scanning tunneling microscopy wave-function imaging of inAs/GaAs cleaved quantum dots with similar height

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 27, Issue 2, 2009, Pages 891-894

  Girard, J C ^a   Lematre A ^a   Miard, A ^a   David, C ^a   Wang, Z Z ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-SECTIONAL SCANNING; DIFFERENTIAL CONDUCTANCES; ELECTRON WAVE FUNCTIONS; ELECTRONIC WAVE FUNCTIONS; INAS/GAAS; LOW TEMPERATURES; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPIES; NANO-METER SCALE; QUANTUM DOTS; REAL SPACES; SPATIAL VARIATIONS; TUNNELING SPECTROSCOPIES; WAVE-FUNCTION;

ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; EXCITED STATES; GALLIUM; SCANNING; SCANNING TUNNELING MICROSCOPY; WAVE FUNCTIONS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 64549091125     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3013854     Document Type: Article

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