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Volumn 16, Issue 3, 2009, Pages 133-142

In-situ FFT impedance spectroscopy during the growth of n-type InP "crysto pores"

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FAST FOURIER TRANSFORMS; III-V SEMICONDUCTORS; INDIUM PHOSPHIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SPECTROSCOPY;

EID: 63849276678     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2982550     Document Type: Conference Paper
Times cited : (8)

References (20)
  • 1
    • 0028441656 scopus 로고    scopus 로고
    • T. Takizawa, S. Arai, and M. Nakahara, Japan J. Appl. Phys. 33(2, 5A), L643 (1994).
    • T. Takizawa, S. Arai, and M. Nakahara, Japan J. Appl. Phys. 33(2, 5A), L643 (1994).
  • 6
    • 84920353065 scopus 로고    scopus 로고
    • H. Fo&dielil, S. Langa, J. Carstensen, S. Lölkes, M. Christophersen, and LM. Tiginyanu, Adv. Mat. 15(3), 183 (2003).
    • H. Fo&dielil, S. Langa, J. Carstensen, S. Lölkes, M. Christophersen, and LM. Tiginyanu, Adv. Mat. 15(3), 183 (2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.